Samsung Electronics Co., Ltd.

Joung-wook Moon

Jung-Sik Kim

Hoon Shung Lee

Seong-Hwan Jeon

Kwun-soo Cheon

A duty cycle corrector (DCC) includes a duty corrector circuit configured to adjust a duty of an input signal to output a duty-adjusted signal; a duty detector circuit configured to generate a correction code associated with the adjustment of the duty, based on a charge pump operation and a counting operation; and a timing controller configured to generate a first control signal associated with the charge pump operation and a second control signal associated with the counting operation in synchronization with a first clock.

Duty cycle corrector, semiconductor device including the same, and method of operating duty cycle corrector

Disclosed are a semiconductor device capable of testing memory cells and a test method. The semiconductor device includes a plurality of terminals, each terminal being configured to receive similar data during a test mode, a plurality of buffers, each buffer being configured to receive data from a corresponding terminal and output either the data or changed data to a corresponding memory cells in response to a control signal, and a control unit configured to generate a plurality of control signals, each control signal being respectively applied to a corresponding buffer.

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Hwaseong-si, South Korea

Joung-wook Moon