Intel Corporation

Joshua T Linden-Levy

Shawn McEuen

Sridhar V Machiroutu

Joseph A Cervantes

Robert W Wolcott

Techniques for precision testing of thermal interface materials are described. An apparatus may include multiple anvils each having multiple sensors disposed along its axis. A thermal interface material may be disposed between the anvils. A control module may be communicatively coupled to said sensors and arranged to receive temperature readings from the multiple sensors to form a temperature gradient, determine a surface temperature for each anvil based on the temperature gradient, determine a heat flux through the thermal interface material based on the surface temperature, and determine a resistance value for the thermal interface material based on the heat flux. Other embodiments are described and claimed.

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Portland, OR, United States of America

Joshua T Linden-Levy