International Business Machines Corporation

Globalfoundries Inc.

Joshua D Friedrich

Michael Stephen Floyd

Gregory Scott Still

Norman Karl James

Kirk David Peterson

Brian William Thompto

Karthick Rajamani

Malcolm Scott Ware

Charles Robert Lefurgy

John Francis Bulzacchelli

Malcolm Scott Allen-Ware

Srinivasan Ramani

Todd Jon Rosedahl

Victor V Zyuban

Tilman Gloekler

Soraya Ghiasi

Zeynep Toprak Deniz

Harold Wayne Chase

Edmund Juris Sprogis

Wolfgang Roesner

Jason D Hibbeler

William Robert Reohr

Phillip John Restle

Alan J Drake

Andrew J Geissler

Seongwon Kim

Liang-Teck Pang

Steven Paul Hartman

Huajun Wen

Thomas J Bucelot

Robert Benjamin Gass

Michael G R Thomson

Elspeth Anne Huston

Richard L Willaman

John R Ripley

Jagat V Pokala

Rick John Weiss

A system for adjusting a frequency of a processor is disclosed herein. The system includes a processor and a memory, where the memory includes a program configured to adjust a frequency of a multi-core processor. The operations include determining a total current and a temperature of the multi-core processor and estimating a leakage current for the multi-core processor. The operations also include calculating a switching current by subtracting the leakage current from the total current and calculating an effective switching capacitance based at least in part on the switching current. The operations also include calculating a workload activity factor by dividing the effective switching capacitance by a predetermined effective switching capacitance stored in vital product data, and enforcing a turbo frequency limit of the multi-core processor based on the workload activity factor.

Deterministic current based frequency optimization of processor chip

A method for adjusting a frequency of a processor is disclosed herein. In one embodiment, the method includes determining a total current and a temperature of the multi-core processor and estimating a leakage current for the multi-core processor. The method also includes calculating a switching current by subtracting the leakage current from the total current. The method also includes calculating an effective switching capacitance based at least in part on the switching current. The method also includes calculating a workload activity factor by dividing the effective switching capacitance by a predetermined effective switching capacitance stored in vital product data, and enforcing a turbo frequency limit of the multi-core processor based on the workload activity factor.

Systems and methods are provided to regulate a supply voltage of a load circuit. For example, a system includes a voltage regulator circuit that includes a passgate device. The system includes a passgate strength calibration control module which is configured to (i) obtain information which specifies operating conditions of the voltage regulator circuit, (ii) access entries of one or more look-up tables using the obtained information, (iii) use information within the accessed entries to determine a maximum load current that could be demanded by the load circuit under the operating conditions specified by the obtained information, and to predict a passgate device width which is sufficient to supply the determined maximum load current, and (iv) set an active width of the passgate device according to the predicted passgate device width.

Passgate strength calibration techniques for voltage regulators

A voltage regulator module (VRM) includes a first interface configured to couple to a first substrate interface at a first voltage. The VRM also includes a second interface configured to couple to a first processor interface at a second voltage. A first regulator module couples to the first interface and to the second interface. The first regulator module is configured to receive power at the first interface, to convert power to the second voltage, and to deliver power to the first processor interface at the second voltage. A method for providing power to a processor includes receiving power from a first substrate interface at a first voltage. The received power is regulated to generate power at a second voltage. The regulated power is provided to a processor at a first processor interface coupled to the processor. The processor interface delivers power to a logic group of a plurality of logic groups of the processor.

Processor voltage regulation

Described is an integrated circuit having a clock distribution network capable of transitioning from a non-resonant clock mode to a first resonant clock mode Transitions between clock modes or between various resonant clock frequencies are done gradually over a series of clock cycles. In example, when transitioning from a non-resonant clock mode to a first resonant clock mode, a strength of a clock sector driver is reduced over a series of clock cycles, and individual ones of a plurality of resonant switches associated with resonant circuits are modified in coordination with reducing the strength of the clock sector driver.

Changing resonant clock modes

During manufacture, an operating range for dynamic voltage and frequency scaling can be established. A nominal operating point is identified based on a design nominal operating frequency for a computer processor. The nominal operating point comprises a nominal operating voltage identified for the design nominal operating frequency. In dependence upon the nominal operating point, an operating range of frequency and voltage over which the computer processor is to function is determined. Information specifying the nominal operating point and the operating range is stored in non-volatile storage associated with the computer processor.

Establishing an operating range for dynamic frequency and voltage scaling

A mechanism is provided for internally controlling and enhancing logic built-in self test in a multiple core microprocessor. The control core may use architectural support for scan and external scan communication (XSCOM) to independently test the other cores while adjusting their frequency and/or voltage. A program loaded onto the control core may adjust the frequency and configure the LBIST to run on each of the cores under test. Once LBIST has completed on a core under test, the control core's program may evaluate the results and decide a next test to run for that core. For isolating failing latch positions, the control core may iteratively configure the LBIST mask and sequence registers on the core under test to determine the location of the failing latch. The control core may control the LBIST stump masks to isolate the failure to a particular latch scan ring and then position within that ring.

Internally controlling and enhancing logic built-in self test in a multiple core microprocessor

A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Identifying deterministic performance boost capability of a computer system

A method, an apparatus and computer instructions are provided for specifying multiple voltage domains of a signal and macros in a processor chip and validating physical implementation and interconnections of the signal and macros. A set of attributes is provided for designs to define multiple voltage domains of a signal and macros in a processor chip. A first validation mechanism is then provided to validate that no electrical or logical errors created by logical connections between macros as defined by the set of attributes. A translation mechanism is provided to translate logical voltage description to a physical netlist for designers to connect powers to macros and signals. A second validation mechanism is provided to validate physical implementation adhere to designers' intent according to the set of attributes defined in the logical design.

Method and apparatus for specifying multiple voltage domains and validating physical implementation and interconnections in a processor chip

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Round Rock, TX, United States of America

Joshua D Friedrich