Government of the United States of America, As Represented by the Secretary of Commerce

National Institute of Standards and Technology

Joshua Ari Gordon

Christopher Lee Holloway

Matthew Thomas Simons

Thomas Crowley

A SI-traceable Rydberg atom radiofrequency power meter determines power of reference radiofrequency radiation and includes: a reference radiofrequency source that provides reference radiofrequency radiation; a vapor cell including: a pair of parallel-plate waveguides; a vapor cell wall including parallel opposing faces of the parallel-plate waveguides; and the vapor space physically bounded by the vapor cell wall to contain gas atoms in an optical overlap volume; and a transmission detector that receives the output light from the vapor cell and produces a transmission signal from the transmission detector for determination of power of the reference radiofrequency radiation, wherein the SI-traceable Rydberg atom radiofrequency power meter determines power of the reference radiofrequency radiation by electromagnetically induced transparency of the gas atoms in a Rydberg electronic state, the determination of power being traceable to the International System of Units (SI).

Si-traceable Rydberg atom radiofrequency power meter and determining power of radio frequency radiation

A quantum atomic receiving antenna includes: a probe laser; a coupling laser; an atomic vapor cell that includes: a spherically-shaped or parallelepiped-shaped atomic vapor space and Rydberg antenna atoms that undergo a radiofrequency Rydberg transition to produce quantum antenna light from probe light such that an intensity of the quantum antenna light depends on an amount of radiofrequency radiation received by the Rydberg antenna atoms, the quantum antenna light including a strength, direction and polarization of the radiofrequency radiation; and a quantum antenna light detector in optical communication with the atomic vapor cell.

Quantum atomic receiving antenna and quantum sensing of radiofrequency radiation

A non-contact coordinate measuring machine includes: a noncontact metrology probe including: first and second cameras, wherein the second camera has a second field of view that overlaps a first field of view in a prime focal volume; a third camera has a third field of view that overlaps the prime focal volume and forms a probe focal volume; a multidimensional motion stage comprising: a machine coordinate system and motion arms that move the noncontact metrology probe in a machine coordinate system; a camera platform on which the cameras are disposed; a tracker with a world coordinate system and that determines a location of the probe focal volume in a tracker field of view, the non-contact coordinate measuring machine having the noncontact metrology probe for non-contact coordinate measurement of an object in an absence a stylus and in an absence of physical contact with the object.

Non-contact coordinate measuring machine using a noncontact metrology probe

A Rydberg atom mixer determines a phase of modulated carrier radiation and includes: a reference radiofrequency source for reference radiofrequency radiation; a modulated carrier source for modulated carrier radiation; a vapor cell to contain gas atoms and that receives reference radiofrequency radiation and modulated carrier radiation, such that the gas atoms produce modulated light modulated; and a transmission detector that receives the modulated light from the vapor cell and produces a transmission signal from the transmission detector for determination of a phase of the modulated carrier radiation, wherein the Rydberg atom mixer mixes the reference radiofrequency radiation and the modulated carrier radiation by the gas atoms in a Rydberg electronic state to produce the intermediate frequency IF that corresponds directly to the phase of the modulated carrier radiation.

Rydberg atom mixer and determining phase of modulated carrier radiation

Disclosed is a noncontact metrology probe including: a first camera including a first field of view; a second camera including a second field of view and arranged such that the second field of view overlaps the first field of view to form a prime focal volume; a third camera including a third field of view and arranged such that the third field of view overlaps the prime focal volume to form a probe focal volume; and a tracker including a tracker field of view to determine a location of the probe focal volume in the tracker field of view. Further disclosed is a process for calibrating a noncontact metrology probe, the process including: providing a noncontact metrology probe including: a first camera including a first field of view; a second camera including a second field of view; a third camera including a third field of view; and a tracker including a tracker field of view; overlapping the first field of view with the second field of view to form a prime focal volume; overlapping the prime focal volume with the third field of view to form a probe focal volume; and overlapping the a tracker field of view with the probe focal volume to calibrate the noncontact metrology probe.

Noncontact metrology probe, process for making and using same

A system and method for imaging and aligning antennas that includes an overlay imaging aligner composed of two or more antennas in association with a polarization gate, a polarization beam splitter, a non-polarizing beam splitter, a beam dump, one or more imaging lens and a common detector array. The overlay imaging aligner aligns the antennas by overlaying simultaneous digital images associated with the antennas on the common detector array. The antennas can be, for example, mm Wave antennas, waveguides, etc. The detector array generates real-time digital images the antennas. Such an approach of simultaneous imaging leverages the spatial resolution of digital optical imaging to aligning antenna components.

Growing community of inventors

Lafayette, CO, United States of America

Joshua Ari Gordon