Micron Technology Incorporated

Josephine Tiu Hamada

Mingdong Cui

Karthik Sarpatwari

Lingming Yang

Joseph M McCrate

Jessica Chen

Kenneth Richard Surdyk

An integrated circuit memory device, having: a first wire; a second wire; a memory cell connected between the first wire and the second wire; a first voltage driver connected to the first wire; and a second voltage driver connected to the second wire. During an operation to read the memory cell, the second voltage driver is configured to start ramping up a voltage applied on the second wire after the first voltage driver starts ramping up and holding a voltage applied on the first wire.

Read spike mitigation in integrated circuit memory

Methods, systems, and devices for memory cell selection to enable a memory device to select a targeted memory cell during a write operation are described. The memory device may apply a first pulse to a selected bit line of the targeted memory cell while applying a voltage to deselected word lines to prevent current leakage. If the targeted memory is not selected after the first pulse, the memory device may apply a second pulse to the selected bit line while applying a voltage to the deselected word lines. If the targeted memory cell is not selected following the second pulse, the memory device may apply a third pulse to the selected bit line while applying the voltage to the deselected word lines. The memory device may detect a snapback event after any of the pulses if the targeted memory cell is selected.

Techniques for applying multiple voltage pulses to select a memory cell

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Folsom, CA, United States of America

Josephine Tiu Hamada