Texas Instruments Corporation

Joseph Milton Yehle

James Henry McGee, Jr

Geoffrey Thomas Haigh

Xu Gao

Clemon Howell

Feng-Min Chang

David Wayne Kaase

L Rene′ Graves

In some examples, a system comprises a non-conductive layer; a conductive sheet positioned on an area of the non-conductive layer; a non-conductive surface in contact with the conductive sheet; a safety enclosure positioned on the non-conductive surface and configured to contain a high-voltage device; a ground connection coupling to the conductive sheet and extending through the non-conductive layer; and a coupling member to couple together the non-conductive layer, the conductive sheet, the non-conductive surface, and the safety enclosure.

Conductive sheets to discharge non-conductive surfaces

A system and method for stress-testing of electronic components are disclosed. The system and method include a stationary bath including a tub that defines an aperture in a plane, in which a plurality of slots are positionable and defined inside the tub and oriented orthogonally with respect to the plane. A dielectric fluid in the tub is heated by a heating element to a predetermined temperature value. A board is configured to be retrievably placed with one of the plurality of slots, the board having a plurality of sockets operable to receive corresponding electronic components.

Stationary bath for testing electronic components

A system has a chip mounting board and a docking board. The chip mounting board can be loaded with test samples in a low voltage environment and can then be transported to a high voltage environment. The chip mounting board can be connected to the docking board and allows high voltage testing of multiple samples in parallel. The chip mounting board can then be disconnected from the docking board and transported back to a low voltage environment to unload the tested samples.

System and method for high voltage stress testing plurality of parallel units

Surge testing systems and methods to surge test a device under test (DUT) in which a host computer controls a pulse generator and an oscilloscope to automatically apply a high voltage pulse from the pulse generator through a current limiter to the DUT, the oscilloscope provides one or more current or voltage waveforms representing a voltage or current associated with the DUT and/or the pulse generator, and the host computer determines a pass or fail condition of the DUT for the applied high voltage pulse according to the waveform or waveforms.

Growing community of inventors

Dallas, TX, United States of America

Joseph Milton Yehle