Xynetics, Inc.

Joseph Kvaternik

A probe including an arm providing structure for fixedly mounting and preloading a leaf spring. A probe tip is fixed to the leaf spring and extends through a guide means on the probe arm. Provision is made for clearance in the fit between the guide and the probe tip so that a predetermined, controlled amount of bending of the tip is allowed when contact is made with a circuit to be tested. Consequently, the tip may move across the circuit in a first direction upon the initial contact. Continued relative movement will cause the tip to retract through the guide means, thereby forcing it to move across the circuit n the opposite direction.

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Belmont, CA, United States of America

Joseph Kvaternik