Lsi Corporation

Agere Systems Inc.

Joseph J Jamann

Vishwas M Rao

James C Parker

Alexander Y Tetelbaum

Bruce E Zahn

Rich Laubhan

William R Griesbach

A method of manufacturing an electronic circuit employing a flexible ramptime limit and an electronic circuit are disclosed. In one embodiment, the method includes: (1) physically synthesizing a logical representation of an electronic circuit employing flexible ramptime limits, (2) performing a timing test on the physically synthesized electronic circuit employing the flexible ramptime limits and a processor and (3) determining if there is a violation of the flexible ramptime limits.

Implementing and checking electronic circuits with flexible ramptime limits and tools for performing the same

A method of designing a model of an integrated circuit block, an electronic design automation tool and a non-transitory computer-readable medium are disclosed herein. In one embodiment, the method includes: (1) generating an input and output timing budget for the block based on design constraints of the block and a netlist of the block, (2) updating the input and output timing budget with clock customization data based on designer knowledge of the integrated circuit and (3) providing the model for the block based on the update of the input and output timing budget, wherein the model represents clock information of the block separately from data path information of the block.

Modeling approach for timing closure in hierarchical designs leveraging the separation of horizontal and vertical aspects of the design flow

One aspect provides a method of designing an integrated circuit. In one embodiment, the method includes: (1) generating a functional design for the integrated circuit, (2) determining performance objectives for the integrated circuit, (3) determining an optimization target voltage for the integrated circuit, (4) determining whether the integrated circuit needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the integrated circuit is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional integrated circuit design that meets the performance objectives by employing standardized data created by designing at least one representative benchmark circuit, and (6) performing a timing signoff of the layout at the optimization target voltage.

Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics

A system for, and method of, generating block timing constraints and a timing model. In one embodiment, the system includes a hierarchical modeling tool configured to: (1) generate a model file, (2) receive at least one abstracted view margin, at least one timing environment margin and at least one operational margin for inclusion in the model file, (3) generate block implementation timing constraints employing the at least one timing environment margin and the at least one operational margin and (4) generate a block timing model employing the at least one abstracted view margin and the at least one operational margin.

System and method for managing timing margin in a hierarchical integrated circuit design process

A method of designing an integrated circuit and a model of an integrated circuit block, an electronic design automation tool, an apparatus and a computer-readable medium are disclosed herein. In one embodiment, the method of designing an integrated circuit includes: (1) generating a timing budget for the integrated circuit employing designer input of the integrated circuit, (2) establishing design constraints for a block of the integrated circuit employing the timing budget, (3) creating an input and output timing budget for the block employing the design constraints, (4) combining implementation information for the integrated circuit based on designer knowledge with the input and output timing budget to generate an updated input and output timing budget and (5) generating a model of the block based on the updated input and output timing budget.

An apparatus and a method of generating a flexible ramptime limit for an electronic circuit, a computer program product that performs the same method, and a method of manufacturing an electronic circuit employing a flexible ramptime limit is disclosed. In one embodiment, the method for generating a flexible ramptime limit includes: (1) calculating a frequency based ramptime limit for the electronic circuit, (2) obtaining a library based ramptime limit for the electronic circuit, (3) determining a minimum ramptime limit between the frequency based ramptime limit and the library based ramptime limit and (4) selecting the minimum ramptime limit as the flexible ramptime limit.

One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing representative benchmark circuits for a clock path, a data path and a flip-flop path, (2) establishing at least one standard sensitization and measurement rule for delay and power for the representative benchmark circuits and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation, (5) writing the data to a databank and (6) parsing and interpreting the data to produce at least one report.

Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional IC design that meets the performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof and (6) performing a timing signoff of the layout at the optimization target voltage.

Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed thereby

One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing at least one representative benchmark circuit, (2) establishing standard sensitization and measurement rules for delay and power for the at least one representative benchmark circuit and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation and (5) parsing and interpreting the data to produce at least one report.

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Nazareth, PA, United States of America

Joseph J Jamann