Ion Tech Limited

Other

Joseph Franks

Dennis John Baghurst

A filter is made from a special form of carbon, selected from the group of diamond-like carbon, pyrolitic carbon, glassy carbon and turbostratic carbon. The special carbon may be on a substrate, for example of polymeric material or a ceramic.

Filter for protinaceous materials

Cell Culture apparatus provides a surface for cell culture, the surface being formed from the group of diamond-like carbon, pyrolytic carbon, glassy carbon and turbostratic carbon. The surface may be part of the container for the culture medium or the surface of microcarriers, such as beads of glass or polymers.

Cell culture apparatus

Heretofore specimens have been thinned to penetration for examination by electron microscopy techniques, by ion erosion techniques. Such technique finds particular suitability to eroding materials made of glass, ceramics, and geological specimens which cannot be treated by chemical etchants. The present disclosure while acknowledging the advances which ion erosion techniques have made in this field, is concerned with a more rapid technique employing a beam or beams comprised solely of neutral particles. In tests carried out using this technique the sputtering rate from a sample specimen has been shown to be several percentages greater using a neutral source than from an ion source with the same flux density.

Thinning of specimens for examination under the electron microscope

Method and apparatus for preparing a specimen for observation under the electron microscope by ion erosion. A saddle-field ion source is employed to irradiate the specimen with the specimen held in close proximity spacing with respect to the cathode aperture of the ion source. Such close proximity spacing ensures that the specimen is thinned at a rapid rate comparable with the rates attained with chemical etching.

Preparation of material for examination by transmission electron

Method for producing specimens suitable for examination by electron microscopy techniques in accordance with which at least one ion beam from an ion source is directed onto a specimen while effecting relative rotation between the ion source(s) and the specimen and simultaneously varying the angle of incidence of ion beam(s) whereby the angle of incidence of the ion beam(s) on the specimen is varied in a random manner. The ion source(s) may remain stationary while rotating and rocking the specimen or the ion source(s) may be rocked and the specimen rotated and rocked or the specimen may remain stationary while rocking and rotating the ion source(s) or both the source(s) and the specimen may be rotated and rocked. In apparatus for carrying out the method of the invention there is provided specimen support means and means for rotating same, at least one ion source adapted to direct at least one ion beam onto the specimen and means for varying the angle of incidence of the ion beam(s) on the surface of the specimen.

Ion beam machining techniques and apparatus

An ion source having an extremely high beam current density at low gas flow rates and therefore, low system pressures. The ion source includes an electrode system which consists of a cathode of, for example, spherical or cylindrical configuration which cathode encloses an anode having a pair of screen electrodes symmetrically disposed about and parallel to the plane of the anode, the anode and screen electrodes each having apertures formed therein. A gas inlet is formed in the cathode wall, preferably between the screen electrodes, and an ion beam outlet aperture of substantially the same size as the anode aperture is provided in the cathode. Upon application of suitable potentials to the anode, cathode and screen electrodes, the latter preferably being at a potential substantially equal to cathode potential, gas introduced through the gas supply inlet is ionised and the positive ions created are accelerated towards the cathode and emerge in a beam through the ion beam outlet aperture.

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Middlesex, United Kingdom

Joseph Franks