Growing community of inventors

Middletown, CT, United States of America

Joseph D Drescher

Average Co-Inventor Count = 2.13

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 64

Joseph D DrescherErik M Pedersen (5 patents)Joseph D DrescherJesse R Boyer (3 patents)Joseph D DrescherWilliam J Brindley (1 patent)Joseph D DrescherBrian Duguay (1 patent)Joseph D DrescherAnton G Banks (1 patent)Joseph D DrescherRandall Joyner (1 patent)Joseph D DrescherJohn Quitter (1 patent)Joseph D DrescherKenneth A Frisk (1 patent)Joseph D DrescherRobert E Erickson (1 patent)Joseph D DrescherKevin J Klinefelter (1 patent)Joseph D DrescherEdward Marchitto (1 patent)Joseph D DrescherJeffry K Pearson (1 patent)Joseph D DrescherMarkus W Fritch (1 patent)Joseph D DrescherKamiko L Darrow (1 patent)Joseph D DrescherEric M Pedersen (1 patent)Joseph D DrescherChristian Jesse (1 patent)Joseph D DrescherBrian Ricciardelli (1 patent)Joseph D DrescherDanielle N Balzano (1 patent)Joseph D DrescherJoseph D Drescher (14 patents)Erik M PedersenErik M Pedersen (6 patents)Jesse R BoyerJesse R Boyer (57 patents)William J BrindleyWilliam J Brindley (28 patents)Brian DuguayBrian Duguay (21 patents)Anton G BanksAnton G Banks (16 patents)Randall JoynerRandall Joyner (11 patents)John QuitterJohn Quitter (7 patents)Kenneth A FriskKenneth A Frisk (7 patents)Robert E EricksonRobert E Erickson (7 patents)Kevin J KlinefelterKevin J Klinefelter (6 patents)Edward MarchittoEdward Marchitto (6 patents)Jeffry K PearsonJeffry K Pearson (5 patents)Markus W FritchMarkus W Fritch (4 patents)Kamiko L DarrowKamiko L Darrow (2 patents)Eric M PedersenEric M Pedersen (1 patent)Christian JesseChristian Jesse (1 patent)Brian RicciardelliBrian Ricciardelli (1 patent)Danielle N BalzanoDanielle N Balzano (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. United Technologies Corporation (12 from 10,654 patents)

2. Raytheon Technologies Corporation (2 from 2,484 patents)


14 patents:

1. 10878554 - Defect detection and measurement method

2. 10832395 - Systems and methods for inspecting bristles using a digital camera

3. 10678206 - Remote feature measurement

4. 10274308 - Precision optical height gauge

5. 9976851 - Accurate machine tool inspection of turbine airfoil

6. 9903781 - Material testing apparatus and method

7. 9476842 - On-the-fly dimensional imaging inspection

8. 9157865 - Machine tool—based, optical coordinate measuring machine calibration device

9. 8797398 - On-the-fly dimensional imaging inspection

10. 8742774 - Apparatus for measuring a radius of a workpiece

11. 7869026 - Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts

12. 7191535 - On-machine automatic inspection of workpiece features using a lathe rotary table

13. 7036236 - Method for certifying and calibrating multi-axis positioning coordinate measuring machines

14. 7025385 - Coupling

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12/8/2025
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