General Electric Company

Joseph Benjamin Ross

Kevin George Harding

Ralph Gerald Isaacs

Guiju Song

Jianming Zheng

Qingying Hu

Donald Wagner Hamilton

Francis Howard Little

Gil Abramovich

Ming Jia

Thomas Watkins Lloyd

Peter William Lorraine

Glen William Brooksby

Steven Jeffrey Gordon

Joseph Leagrand Mundy

John L Schneiter

Thomas William Birdwell

Van-Duc Nguyen

Richard L Trantow

Christopher Reynolds Hammond

Ronald Cecil McFarland

Victor Nzomigni

John Charles Janning

Faycal Benayad-Cherif

Esmaeil Heidari

Xiaoping Qian

Yongqing Li

Yu Ning

Jeffery John Reverman

James Robert Reinhardt

Thomas Watkins Lloyd, Jr

Oingyang Hu

A method involves receiving a test image of at least a portion of a test object which includes a test moir&#xe9; pattern generated by superposing one or more reference gratings on one or more subject gratings. The method further involves analyzing one or more test beat lines in the test moir&#xe9; pattern and calculating one or more test values based on the analysis of the one or more test beat lines. The one or more test values are a function of one or more rotational angles corresponding to the one or more subject gratings and a shape of at least the portion of the test object. The method also involves calculating one or more angular errors of the one or more subject gratings based on the one or more test values and one or more template values and sending a notification based on the one or more angular errors.

System and method for inspecting an object

An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

Inspection system and method with multi-image phase shift analysis

A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.

Inspection system and methods with autocompensation for edge break gauging orientation

A method for inspecting an object includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.

Methods and apparatus for inspecting an object

A computer-implemented method, system, and computer program code are provided for characterizing an edge break, e.g., part features and/or geometric discontinuities that could give rise to edge sharpness, as may be encountered in a chamfer, bevel, fillet and other part features. The methodology enables to accurately and consistently determine in a manufacturing setting, for example, any applicable geometric parameter for characterizing the edge break.

Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined part

A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to be inspected, and generating an electronic mask based on the determined object profile. The electronic mask has an electronic opening having a profile defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.

A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined reference image) of an ideal model for the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the ideal model for the object. A transformation estimator compares the scanned image to the reference image and provides a transform which maps the scanned image to the reference image and provides a set of registered object data points. One or more filter modules process the registered object data points with a priori information to reduce noise and to further enhance the accuracy and precision of the registration. A gauge estimator is coupled to the filter module. The gauge estimator utilizes the processed and registered object data to determine deformation parameters of the object, which are then displayed to an operator as gauging information.

Non-contact measurement method and apparatus

An image processing method for structured light profiling includes sampling an image of a structured light pattern to obtain an intensity distribution, selecting a number of sets of sampled points from the intensity distribution. Each of the respective sets includes a number of sampled points. The image processing method further includes fitting each of the sets of sampled points to a respective distribution function and filtering the distribution functions to select a representative distribution function for the intensity distribution.

Method and system for image processing for structured light profiling of a part

A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.

An NDE test data record management system is provided. The test data record management system can include a format conversion server, a local archiving server, a cataloging server, an image and data cache server, and an image query and review station.

Method of processing test information

A multi-resolution inspection system and method of operation. The system may comprise a first scanning system having a first resolution, wherein the first scanning system is operable to perform a first resolution scan of a surface area of an object to identify a location of a surface abnormality in the object. The system may also comprise a second scanning system having a second resolution, the second resolution being smaller than the first resolution. The second scanning system is operable to receive the location of the surface abnormality from the first scanning system and to automatically perform a second resolution scan of a defined region of the object around the location of the surface abnormality.

Multi-resolution inspection system and method of operating same

A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.

Methods and apparatus for measuring flow opening areas

A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.

Non-contact measurement system for large airfoils

A method enables a surface contour of an object to be measured using an optical system. The method includes positioning the object in a measurement cell, filling the cell with fluid, transmitting light towards the object in the measurement cell, measuring the illumination of a surface of the object, generating an image of the object based on the illumination of the surface.

Methods and apparatus for measuring a surface contour of an object

A method for optical part shape measurement of a bare metal part to determine acceptability of the manufactured part. A variable level light source illuminates the part which is mounted on positioning equipment that allows the part to be moved from one position to another. Localized variations in light level are first determined and are compared with a reflectivity model of the part to determine optimization of the setup. Light level and viewing orientation of the part are adjusted to optimize the quality of test data obtained. Data quality is reviewed to ascertain a confidence factor for each location on the part's surface. Using both the reflectivity model and quality test results, data acquired for specified areas of the part is either accepted or rejected. Light level and part orientation are changed based upon how a reflectivity map of the part changes with each adjustment. New and acceptable data are now acquired for those areas of the part where data was previously discarded. This new acceptable data is combined with the previously acceptable data to obtain a complete set of data upon which acceptability of the part is determined.

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Cincinnati, OH, United States of America

Joseph Benjamin Ross