Wyko, Inc.

Hughes Aircraft Company

Joseph A Lamb

Eric M Frey

Chiayu Ai

James V Semrad

An interferometer mounting mechanism that consists of a horizontal shaft rigidly connected to the interferometer in axial alignment with the optical path of the instrument and protruding through an opening in the center of the transmission flat. A sample stage adapted to receive a computer-drive disk is attached to the distal end of the shaft, so that the stage is directly and rigidly connected to the interferometer. The sample stage consists of a hub capable of retaining a disk in precise alignment with the transmission flat by hanging its center hole on two support posts and resting the disk on three pressure tips on the hub. A system of push-pull adjustment screws is provided to set the proper tip/tilt of the disk.

Coaxial disc-mount for measuring flatness of computer-drive discs by

A scanning phase-shifting mechanism comprising reference optics supported by three independent supporting members disposed in fixed triangular relation in a plane substantially normal to the optical axis of the instrument. Two upper members support all of the weight of the optics and provide a preferably horizontal, first axis of rotation for adjustment of the tip of the optics in relation to the optical axis of the instrument. The lower member does not support any of the weight of the optics, providing instead only longitudinal support to cause motion during translation. In addition, in conjunction with at least one of the upper members, the lower member provides a second axis of rotation, preferably orthogonal to the first axis, for adjustment of the tilt of the optics. Each supporting member is rigidly connected to a first end of a cantilevered flexure which is anchored at the other end to a stationary support structure housing the micromotion-translation mechanism of the phase-shifting interferometer. A piezoelectric element couples the support structure with the first end of each flexure.

Horizontal-post/vertical-flexure arrangement for supporting large

A pair of spaced apart probes generally approximating the contact geometry of conveyed object to be wave soldered is similarly conveyed past and in contact with the solder wave. A timing circuit interconnects with the probes and measures the dwell time of the pair of probes in contact with the solder wave. The probes may have different shaped solder wave contacting parts (e.g., linear edge, points).

Growing community of inventors

Tucson, AZ, United States of America

Joseph A Lamb