Johnstech International Corporation

Other

Jose E Lopez

Dennis B Shell

Mathew L Gilk

David A Johnson

John E Nelson

Mehdi Attaran

Meditation cube

A test device for manually testing chips/ICs is disclosed. A housing includes a receiver for a device under test (DUT). The DUT must be pressed into the housing to make adequate contact with the test pins in the bottom of the test device. A screw drive presses the DUT into position and a plurality of holes in the turning knob accommodate through-going pins which on one leg extend through the knob and into an interference path of a fixed barrier stop. The extended leg then engages the stop during rotation to end the downward movement of the screw. Adjustment is made by selecting holes where the pins are inserted. Reversing the pins in the hole allows for storage of the pins when not in use.

Manual test socket and method of adjustment

A structure and method of constructing a tip for a contact pin used in IC test housing for testing integrated circuits. As the pin is deflected when the device under test (DUT) pad engaged the tip of the pin, the tip pressure normally increases as the elastomers biasing the pin are engaged. This causes the elastomer supporting the tip to increase pressure. By widening the tip as it rolls, the pressure is maintained more constant. Also, as the top wears, the pressure on the DUT will be reduced. By making the contact area of the tip to DUT smaller as it wears, the pressure can be made more constant.

Constant pressure pin tip for testing integrated circuit chips

An electrical contact device having a housing with a square or rectangular hole formed within first and second crossing channels that extends laterally from the hole. A conductive first contact element fits into the hole, while a second contact element fits onto the top opening of the first contact element. The primary and secondary contact elements have flange protrusions that overlap. In addition, the second contact element has a tail with an oblique surface facing the top of a compliant uniform rod and the proximate primary or secondary protrusion of the first contact element. A compliant rod is positioned between the first contact element's primary and secondary protrusions, such that when the first contact element is positioned over a fixed surface and the second contact element is pushed downward when an inward force is applied, the second contact element's external contact surface slides laterally.

Self cleaning slotted electrical contact device for semiconductor contacts

A structure and method of constructing a tip for a contact pin used in IC test housing for testing integrated circuits. As the pin is deflected when the device under test (DUT) pad engaged the tip of the pin, the tip pressure normally increases as the elastomers biasing the pin are engaged. This causes uneven pressure on the tip and will create debris and reduce tip life. By making the surface of the tip wider in the X or Y direction the surface pressure is reduced during the pin contact cycle. It is also possible to reduce tip pressure by having the top surface change in the Z axis so that recedes downwardly along its travel path, the pressure is reduced.

Constant stress pin tip for testing integrated circuit chips

An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

Test socket

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

Growing community of inventors

Sunnyvale, CA, United States of America

Jose E Lopez