Adv Antest Corporation

Advantest (singapore) Pte Ltd

José Moreira

Jan Hesselbarth

Zhan Zhang

Hubert Werkmann

Fabio Pizza

Paolo Mazzucchelli

Giovanni Bianchi

Markus Rottacker

Serafin Fischer

Alexander Quint

An embodiment provides a measurement arrangement for characterizing a radio frequency arrangement comprising a plurality of antennas. Measurement arrangement comprises a dielectric waveguide slab with a plurality of frequency converting structures, arranged in or on the dielectric waveguide slab. Measurement arrangement further comprises a plurality of waveguide transitions arranged at different positions of the dielectric waveguide slab and are coupled to respective radio frequency components. Radio frequency components are configured to transmit and/or receive radio signals. Frequency converting structures are associated with respective antennas of the plurality of antennas, and are configured to perform a frequency conversion on signals received, resulting in frequency-converted signals. Frequency converting structures are further configured to couple respective antennas with the dielectric slab in a frequency converting manner to establish a frequency-converting coupling between the antennas and the plurality of waveguide transitions to cause a frequency-converting coupling between the antennas and the radio frequency components.

Measurement arrangement for characterizing a radio frequency arrangement having a plurality of antennas

A high frequency power divider circuit for distributing an input signal to two or more signal output ports, comprising: a rat race coupler, wherein the rat race coupler is configured to couple an input signal provided at an input port of the rat race coupler to a first output of the rat race coupler and to a second output of the rat race coupler; a first coupling structure coupled to the first output of the rat race coupler, to couple the first output of the rat race coupler with a first signal output port; and a second coupling structure coupled to the second output of the rat race coupler, to couple the second output of the rat race coupler with a second signal output port; wherein a characteristic impedance of a first transmission line portion between the input port and the first output of the rat race coupler deviates from a nominal ring impedance of the rat race coupler in a first direction, and wherein a characteristic impedance of a second transmission line portion between the input port and the second output of the rat race coupler deviates from the nominal ring impedance of the rat race coupler in a second direction, which is opposite to the first direction.

High frequency power divider/combiner circuit including a rat-race coupler coupled by first and second coupling structures to first and second input/output ports

Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location for receiving a DUT, and an adapter or probe is used to wirelessly 'over-the-air' (OTA) electronically test a DUT with an embedded antenna or antenna array with the measurement probelocated in close proximity to the DUT. The probe can be located very close to the DUT (e.g., in the near-field region). Although the probe is located in close proximity to the DUT antenna or antenna array elements it does not significantly disturb or interfere with probe during testing.

Test equipment for testing a device under test having an antenna

The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).

Test arrangement for testing high-frequency components, particularly silicon photonics devices under test

Embodiments of the present invention provide systems and methods for performing tests on a device under test (DUT) based on training data derived from a set of training DUTs using nearfield measurement data. Nearfield measurement data can be mapped to performance metrics that approximate performance metrics derived from the far-field measurement data. Nearfield measurements can then be performed on a DUT to generate second nearfield measurement data, and performance metrics of the DUT are generated using the second nearfield measurement data and the mapped performance metrics derived from the training DUTs.

Determining performance metrics for a device under test using nearfield measurement results

Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location, a probe, and a ground area configured to serve as an antenna ground area for the antenna of the DUT. The ground area includes a slot that the antenna feed impedance is not affected or not affected significantly. The probe is adapted to weakly couple to the antenna of the DUT via the opening to probe a signal when the antenna of the DUT is fed by the circuit of the DUT and/or in order to couple a signal to the antenna which is fed to the circuit of the DUT by the antenna.

Test equipment for testing a device under test having a circuit coupled to an antenna

A method for testing electronic devices involves receiving a stimulus signal for testing a device; changing an operating temperature of at least a component of an electrical filter while maintaining settings of the electrical filter, thereby altering the stimulus signal as the stimulus signal passes through the electrical filter, to create an altered stimulus signal; and outputting the altered stimulus signal.

Growing community of inventors

Stuttgart, Germany

José Moreira