Carl Zeiss Microscopy Gmbh

Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Jörg Siebenmorgen

Wolfgang Singer

Ralf Wolleschensky

David R Shafer

Thomas Kalkbrenner

Helmut Lippert

Ingo Kleppe

Ralf Netz

Artur Degen

Saskia Pergande

Tiemo Anhut

Florian Fahrbach

Matthias Wald

Lars-Christian Wittig

Michael Gölles

Jan Huisken

Jakob Haarstrich

Andreas Möbius

Daniel Schwedt

Daniel Haase

Manuel Amthor

Peter Schacht

Martin Beck

Helge Eggert

Jörg Ritter

Sebastian Borck

Toni Eichelkraut

A method for light sheet microscope examination of a specimen, the specimen being illuminated with a light sheet by an illumination objective, and a light sheet microscope for performing the method. Light emitted by the specimen is imaged onto an area-type detector by a detection objective. An optical axis of the detection objective encloses with an optical axis of the illumination objective an angle that differs from 0° and from 180° and intersects the light sheet in a light sheet plane. The area-type detector records an image. A neural network analyzes the image to determine whether the light sheet plane is located in a focal plane of the detection objective, and/or in which direction along the optical axis the light sheet plane is located from the focal plane, and/or at what distance, measured along the optical axis of the detection objective, the light sheet plane is from the focal plane.

Method and apparatus for analysis of a sample by light sheet microscopy

An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (λ), a second light source for outputting light of at least one second wavelength (λ), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (λ) is not diffracted by the diffraction grating, and light of the second wavelength (λ) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.

Method and device for illuminating a sample plane

A light beam shaping arrangement for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam. The first partial beam is directed to the first liquid crystal region or lifting micromirror region, and into a second partial beam, which is directed to the second liquid crystal region or lifting micromirror region, and the two partial beams returning from the liquid crystal regions and directs them together as an outgoing light beam.

Optical arrangement and method for light beam shaping for a light microscope

An optics arrangement for flexible multi-color illumination for a light microscope includes an acousto-optical tunable filter ('AOTF'). The AOTF is set up to diffract two light components from incident illumination light into different order-of-diffraction directions. The two light components differ in their wavelengths and polarizations. Alternatively, an electro-optical modulator ('EOM') can be used, with which two temporally successive light components of different wavelengths are set to different polarization directions. A polarization beam splitter separates the two light components of different wavelengths and polarizations into reflection light, which is reflected at the polarization beam splitter, and transmission light, which is transmitted at the polarization beam splitter. A light structuring apparatus imprints different structures onto the transmission light and the reflection light. The structured transmission light and the structured reflection light are then recombined by the polarization beam splitter or a further polarization beam splitter onto a common beam path.

Optics arrangement for flexible multi-color illumination for a light microscope and method to this end

An optical lens for use in a media feed device, having a first lens surface and a second lens surface, wherein the first lens is provided to be facing an object to be observed and the second lens surface is provided to be facing away from the object to be observed. At least one channel opening onto the first lens surface is present, wherein the at least one channel runs through the optical lens and at least one section of a media line is formed in the at least one, channel or, if a plurality of channels are formed, at least one of the plurality of channels opens up outside a highest point in alignment with a line that is vertical with respect to the first lens surface and to the surface of the earth.

Optical lens for use in a media supply device and lens, media supply device and microscope

Method for calibrating a phase mask in a beam path of an optical device with the steps: the phase mask is actuated successively with different patterns of grey levels, wherein a first grey level of a first quantity of segments remains constant and a second grey level of a second quantity of segments is varied from one pattern to the next, light of the optical device impinges on the phase mask, at least one part of the total intensity of the light in the beam path is measured downstream of the phase mask for the different patterns, and a characteristic of the measured intensity is obtained in dependence on the second grey level, a relationship between the second grey level and a phase shift, being imprinted by the phase mask, is obtained from the characteristic and an actuation of the phase mask is calibrated based on the obtained relationship.

Method for calibrating a phase mask and microscope

An optical arrangement for light beam shaping in a light microscope has a first and a second liquid crystal region, each of which has a plurality of independently switchable liquid crystal elements with which a phase of incident light is changeable in a settable manner. A first polarization beam splitter is arranged in such a way that incident light is split in a polarization-dependent manner into reflection light, which is reflected in the direction of the first liquid crystal region, and transmission light, which is transmitted in the direction of the second liquid crystal region. The first or a second polarization beam splitter is arranged such that the reflection light and transmission light are combined onto a common beam path after phase modulation by means of the liquid crystal regions.

A method is useful for generating an overview image using a high-aperture objective. An optical detection beam path with the objective is provided. The path is transferred into a second operating state via a first depth of field increased to a second depth of field. Detection radiation is captured in the second operating state. Detection radiation coming from the sample space is collected by the objective, guided along the path, and captured by a detector sensitive to detection radiation as an image with a lateral image field, which is the same in the first and second operating states.

Method for generating an overview image using a large aperture objective

The invention relates to an illumination apparatus for a microscope, a microscope and a method for operating the illumination apparatus. The illumination apparatus has a sample space for holding a sample that is to be illuminated, and at least one laser light source. An objective for the directional emission of laser radiation of a first wavelength along a first optical axis that is directed into the sample space, and with a cover of the sample space by which the sample space is delimited at least on one of its sides. The cover further has a layer that is either impenetrable for the laser radiation over a blocking angle range of the illumination angle and is transmissive for radiation of a second wavelength over a transmitted light angle range, or has a controllable layer that, in a first control state, is transparent for radiation of the second wavelength and, in a second control state, is impenetrable for the laser radiation of the first wavelength.

Illumination apparatus for a microscope, method for operating it, and microscope having an illumination apparatus

A method for adjusting a specimen holder in the beam path of a microscope, in which at least one beam of an illumination radiation is directed onto the specimen holder; a component of the illumination radiation reflected by the specimen holder is captured by means of a detector and measurement values of the captured illumination radiation are ascertained. A current actual manner of positioning of the specimen holder in relation to the beam path is established depending on the measurement values; the established actual manner of positioning is compared to an intended manner of positioning, and control commands for modifying the actual manner of positioning are produced, the execution of which causes the specimen holder to be moved into the intended manner of positioning.

Inclination measurement and correction of the cover glass in the optical path of a microscope

A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Method for operating a microscopy arrangement and microscopy arrangement having a first microscope and at least one further microscope

An arrangement for TIRF microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier in a specimen plane via an illumination beam path. An optical axis of the illumination objective includes an illumination angle that differs from zero with the normal of the specimen plane. A detection optical unit with a detection objective in a detection beam path includes a detection angle that differs from zero between an optical axis thereof and the normal of the specimen plane. A transition element between the specimen carrier and both objectives is arranged both in the illumination beam path and in the detection beam path. The transition element corrects aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen.

Arrangement, microscope and method for TIRF microscopy

An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.

Arrangement for microscopy and for correction of aberrations

A method for providing an overview image of an object that is arranged in a sample plane and includes generating a light sheet, capturing detection light coming from the sample plane, imaging the captured detection light by means of a detector in a detection plane in the form of image data of at least one captured image, wherein the captured image extends in an image plane that is inclined with respect to the sample plane, capturing a number of images of at least one region of the object, in the form of an inclined stack, and transforming the inclined stack to a normalized Z-stack, in which image data of the captured images are assigned with correct orientation with respect to the reference axis. A maximum intensity projection in the normalized Z-stack, wherein a resulting overview image is generated by way of selected image points being imaged as a virtual projection into a projection plane that is parallel to the image plane of the detector.

Growing community of inventors

Jena, Germany

Jörg Siebenmorgen