Semiconductor Components Industries, LLC

Jorg Jos Daniels

Dieter Jozef Joos

Francois Laulanet

Illustrative integrated circuit devices are provided with built-in self test circuit designs and verification methods. One disclosed integrated circuit device includes: an analog circuit block configured to be powered by a current flow from a first power rail and an intermediate node; a current sensor configured to provide digital measurements of the current flow; a built-in self test circuit configured to set the analog circuit block in a sequence of operating modes and coupled to the current sensor to capture for each operating mode a corresponding one of the digital measurements.

Built-in self test with current measurement for analog circuit verification

In an embodiment, a differential buffer may include a first input stage that compares a non-inverting portion of an input signal alternately to a non-inverting portion of an output and to an inverting portion of the output. Another embodiment of the differential buffer may also include a second input stage that compares the inverting portion of the input signal alternately to the inverting portion of the output signal and to the non-inverting portion of the output signal. Other embodiments of the differential buffer may include a feedback chopper switch that transfers the non-inverting portion of the output signal and the inverting portion of the output signal to the first input stage and to the second input stage.

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Outgaarden, Belgium

Jorg Jos Daniels