Haag-Streit Ag

Jörg Breitenstein

Lucio Robledo

Peter Stalder

André Meznaric

Christian Zoss

André Huber-Meznaric

Rudolf Waelti

Ernst Rindlisbacher

Kaspar Baltzer

Bernhard Von Waldkirch

Silja Kiriyanthan

Jonas Haehnle

Claudio Dellagiacoma

Urs Buri

Frank Zumkehr

Thomas Killer

Julian V Kool Van Langenberghe

Christian Schläppi

The ophthalmologic microscope comprises a first component including a base and a stage, a second component including a pivotal arm and a microscope device, and a third component including a pivotal arm and a light source. The various components are mutually pivotal at a hinge. An electronically controlled brake and a position sensor are incorporated into the hinge. The brake controller of the microscope is adapted to interrupt a manual mutual displacement of the components in response to a signal from the position sensor in order to assist the user in properly aligning the components.

Ophthalmologic microscope with at least one controlled manual degree of freedom

In the device and method, the angle of incidence of slit light onto an eye to be examined is determined from its Purkinje reflection recorded in an image by measuring the offset from the reflection to the apex of the image of the cornea. In another embodiment, Purkinje reflections of light sources arranged around the optical axis of the microscope are correlated with a reference pattern of radial stripes in order to determine the offset between the optical axis and the apex of the eye.

Device and method for determining the orientation of an ophthalmologic microscope device

A Michelson-interferometer which has two reference arms and a short coherence length is used for the method and apparatus for measurement of geometric values on transparent or diffuse objects (). The basic optical delay times of the reference arms () are chosen in such a manner that they result in an optical delay time difference corresponding to a layer thickness, as a geometric value. The at least two reference arm beams () are passed to a single rotating path-length variation element (), with a mutual spatial offset angle (dw). A delay-time change, which is dependent on the rotation angle, of the reference arm beams is produced as a function of a rotation angle caused by rotation, in order to allow a delay-time change caused by the path-length variation element () to be applied successively to the basic optical delay times in the reference arms (). A topography as a further geometric value is obtained by projection of a light-intensity structure onto a surface to be measured, and by measurement of its image.

Method and apparatus for determination of geometric values on a transparent or diffusive object

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Bern, Switzerland

Jörg Breitenstein