Koninklijke Philips Corporation N.v.

Joost Adrianus Van Rooijen

Peter George Van De Haar

Fred Simon Berend Van Nijnatten

Petrus Johannes Withagen

Erik Hummel

An X-ray system comprises an assembly that is moveable to different scan coordinates to acquire X-ray projection images at the different scan coordinates in a dynamic mode while the assembly is moving. The assembly is also moveable to a predetermined reference coordinate to acquire an X-ray projection image at the predetermined reference coordinate in a static mode while the assembly is resting. The X-ray system also comprises a processor configured to obtain dynamic gain calibration parameters from the X-ray projection images acquired in the dynamic mode at one of the different scan coordinates; obtain a static gain calibration parameter from the X-ray projection image acquired in the static mode at the predetermined reference coordinate; and determine adjusted dynamic gain calibration parameters.

Static gain calibration

The present invention relates to a device for controlling a position of an anti-scatter grid in an X-ray image acquisition system, the device () comprising: a measurement unit (); a control unit (); and a shifting unit (); wherein the measurement unit () is configured to determine an X-ray beam focus position () of an X-ray radiation source of the X-ray image acquisition system with respect to an X-ray detector of the X-ray image acquisition system; wherein the control unit () is configured to generate a shifting signal based on a displacement () between the X-ray beam focus position () and a grid focus position () of the anti-scatter grid; and wherein, based on the shifting signal, the shifting unit () is configured to shift an anti-scatter grid of the X-ray image acquisition system in at least one direction to align the anti-scatter grid with the X-ray beam focus position (), provides an improved anti-scatter grid for X-ray acquisition systems. The invention provides the use of an improved anti-scatter grid () for X-ray acquisition systems ().

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Best, Netherlands

Joost Adrianus Van Rooijen