Korea Advanced Institute of Science and Technology

Samsung Electronics Co., Ltd.

Joonkyo Jung

Jonghwa Shin

Insung Joe

Jong Uk Kim

Taeyong Chang

An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.

Optical measurement device with universal metasurface and optical measuring method using the same

A light sensing device includes a semiconductor layer including a distributed Bragg reflector including a first surface of the semiconductor layer, and a photoelectric conversion unit including a second surface of the semiconductor layer, and the distributed Bragg reflector has a plurality of holes each having, in a cross-sectional view, a width gradually changing from a first width to a second width according to a width change period; a first electrode in one region of the semiconductor layer; and a second electrode on the second surface of the semiconductor layer and having a reflective metal.

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Daejeon, South Korea

Joonkyo Jung