Psia Corporation

Joonhyung Kwon

Young Seok Kim

Sang-il Park

Sang-Il Park

Jaewan Hong

A mounting mechanism for the probe head of a Scanning Probe Microscope (SPM) includes two dovetail and two right and left threaded pushdown screws, for convenient mounting and clamping of the probe head. After inserting the probe head between the upper and lower dovetails of the z stage, handles of the pushdown screws are turned so that the lower portion of the upper dovetail rail clamp down the probe head. This mounting mechanism using the dovetail rails and pushdown screws ensures rigid mount and convenient use of the probe head at the same time.

Scanning probe microscope with improved probe head mount

A mounting mechanism for the probe tip of a Scanning Probe Microscope (SPM) includes a scanner supported by a stationary frame, and a kinematic mechanism supported by the scanner. The kinematic mechanism includes at least three protrusions and at least one magnet. The mounting mechanism for the probe tip also includes a chip mount having a hole, a slot and a flat surface. The chip mount, on being held by the magnet, provides an easy way to mount the probe tip without requiring any tools.

Scanning probe microscope with improved probe tip mount

A scanning probe microscope uses two different scanners (also called &ldquo;scanning stages&rdquo;) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called &ldquo;x-y scanner&rdquo;) scans a sample in a plane (also called &ldquo;x-y plane&rdquo;), while the other scanner (called &ldquo;z scanner&rdquo;) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called &ldquo;z direction&rdquo;) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Growing community of inventors

Gunpo, South Korea

Joonhyung Kwon