Samsung Electronics Co., Ltd.

Joohyun Jeon

Suhwan Kim

Young-Lim Park

Jong-Bom Seo

Kyuho Cho

Sunmin Moon

Sangyeol Kang

Sungjin Kim

Satoru Yamada

Min Hee Cho

Seunghyun Kim

Junsoo Kim

Moonyoung Jeong

Chulwoo Park

Sangwoon Lee

Chunhyung Chung

Kyo-Suk Chae

Hyoshin Ahn

Taeyoon An

Sungsam Lee

Eunae Choi

Wonki Roh

Seongjae Byeon

Hyoeun Jung

A method of modeling damages to a crystal caused by an incident particle includes obtaining particle information and crystal information; estimating energy loss of the incident particle based on the particle information and the crystal information; estimating a volume of a vacancy based on the energy loss; estimating a vacancy reaction based on the crystal information and the volume of the vacancy; and generating output data based on the vacancy reaction, the output data including quantification data of the damages.

System and method for modeling damages caused by incident particles

A capacitor includes a first electrode and a second electrode spaced apart from each other, a dielectric layer disposed between the first electrode and the second electrode, and a seed layer disposed between the first electrode and the dielectric layer. The dielectric layer includes a dielectric material having a tetragonal crystal structure. The seed layer includes a seed material that satisfies at least one of a lattice constant condition or a bond length condition.

Capacitor, semiconductor device and methods of manufacturing the capacitor and the semiconductor device

A semiconductor device including a semiconductor substrate including a trench, the semiconductor substrate having a crystal structure; and an insulating layer covering an inner sidewall of the trench, wherein the inner sidewall of the trench has at least one plane included in a {320} family of planes of the crystal structure or at least one plane similar to the {320} family of planes.

Semiconductor device and method for manufacturing the same

Growing community of inventors

Hwaseong-si, South Korea

Joohyun Jeon