Samsung Display Co., Ltd.

Samsung Mobile Display Co., Ltd.

Joo-Hwa Lee

Soon-Ryong Park

Hee-Seong Jeong

Woo-Suk Jung

Eun-Ah Kim

Chul-Woo Jeong

Noh-Min Kwak

Hee-Chul Jeon

Hee-chul Jeon

Jae-Yong Kim

Won-Hyouk Jang

Ki-Yong Lee

Jin-Wook Seo

Byoung-Keon Park

Tae-Hoon Yang

Oh-Seob Kwon

Yong-Soo Lee

Suk-Beom You

Joo-Chul Yoon

Su-Bin Song

Sung-Hoon Kim

Dong-Hyun Kim

Gun-Shik Kim

Jun-Sik Oh

Eu-Gene Kang

Jae-Shin Kim

Min-Jeong Hwang

Eugene Kang

Shingo Kawashima

Dae-Yong Kim

Hyo-Jin Han

Kil-Ho Ok

An organic light emitting diode (OLED) display includes a substrate where OLEDs are formed and an encapsulation member fixed onto the substrate while covering the OLEDs. The encapsulation member includes a photochromic material so that the encapsulation member is colored by external light.

Organic light emitting diode display

A flexible display includes a flexible base substrate, a thin film transistors layer formed on the flexible base substrate, and a light emitting elements layer formed on the thin film transistors layer, where the flexible base substrate includes a first support layer formed below the thin film transistors layer, a second support layer disposed below the first support layer, and a heat-energy blocking/reflecting layer provided between the first support layer and the second support layer. The heat-energy blocking/reflecting layer is configured to block or reflect a sufficient portion of radiated heat-energy that is generated when the flexible base substrate is separated from a supporting carrier substrate so as to prevent the damage from the radiated heat-energy to the light emitting elements layer.

Flexible display having damage impeding layer and method for manufacturing the same

An apparatus for fixing a metal mask includes a first substrate, a magnet array structure, a second substrate, and a metal mask. The magnet array structure includes a plurality of magnets. The magnet array structure is disposed on the first substrate. The plurality of magnets includes their respective magnetic axes. The magnetic axes cross each other. The second substrate is disposed on the magnet array structure. The metal mask is disposed on the second substrate.

Apparatus for fixing metal mask

An organic light emitting diode display device constructed with an organic light emitting element including a first electrode, an organic emission layer, and a second electrode sequentially laminated together, a transmittance control layer formed on the organic light emitting element, a selective reflective layer formed on the transmittance control layer, a polarizing plate formed on the selective reflective layer, and a phase retardation plate disposed between the organic light emitting element and the polarizing plate.

A device for manufacturing a display device includes a deposition source; a deposition thickness calculator for calculating a deposition thickness of a deposition material deposited on a substrate; and a controller for controlling a power of a heater which heats the deposition source by comparing the deposition thickness calculated with a reference thickness. The controller controls the power of the heater either at least one time for each substrate on which the thin film is to be deposited or at regular intervals while the deposition material is deposited. Influence of measurement noise that is included in a quartz crystal sensor for measuring a deposition speed may be minimized, and distribution of deposition thickness of an organic light emitting material may be reduced, thereby increasing the yield of the deposition process and producing quality display devices.

Device and method for fabricating display device

Embodiments provide an organic light emitting diode display. The display includes a substrate, a pixel electrode formed on the substrate, and an organic emissive layer formed on the pixel electrode. A common electrode is formed on the organic emissive layer. In addition, a crystallized light scattering layer is formed on the common electrode. The crystallized light scattering layer may be a crystallized organic or crystallized inorganic layer having a rough surface in order to effectively scatter light and prevent phenomenon, such as Newton's Rings from occurring in the display.

An organic light emitting diode display including: a substrate; pixel electrodes formed on the substrate; a pixel defining layer having openings exposing the plurality of pixel electrodes, formed on the substrate; spacers formed on the pixel defining layer; organic emission layers formed on the pixel electrodes; a common electrode formed on the organic emission layers; and color filters formed on the common electrode, in the openings of the pixel defining layer.

An organic light emitting diode (OLED) display, a display device including the same, and associated methods, the OLED display including a substrate member, an organic light emitting element on the substrate member, and a liquid crystal polymer layer on the organic light emitting element, wherein the liquid crystal polymer layer is configured to delay a phase of light passing therethrough.

Organic light emitting diode display, display device including the same, and associated methods

An organic light emitting diode display including: a substrate; a plurality of pixel electrodes formed on the substrate; a pixel defining layer formed on the substrate, having openings exposing the pixel electrodes; a plurality of spacers disposed on the pixel defining layer; organic emission layers formed on the pixel electrodes; a common electrode formed on the organic emission layers; and a capping layer formed on the common electrode, to cover the organic emission layers.

A thin film transistor (TFT), a method of fabricating the same, and an organic light emitting diode (OLED) display device including the TFT. The TFT includes a substrate having a pixel region and a non-pixel region, a semiconductor layer, a gate insulating layer, a gate electrode, and source and drain electrodes disposed on the pixel region, at least one gettering site disposed on the non-pixel region, and at least one connection portion to connect the at least one gettering site and the semiconductor layer. The method of fabricating the TFT includes patterning a polycrystalline silicon (poly-Si) layer to form a plurality of semiconductor layers, connection portions, and at least one gettering site, the semiconductor layers being connected to the at least one gettering site via the connection portions, and annealing the substrate to getter the plurality of semiconductor layers.

Method of fabricating a thin film transistor from amorphous silicon and organic light emitting diode display device having the thin film transistor

A display device and a driving method thereof for easily determining photographing timing and recognizing text by improving field visibility. The display device includes: a signal controller generating image data and an image control signal in accordance with an input signal; and a display unit including scan lines transmitting scan signals, data lines transmitting data signals, and pixels connected to the scan lines and data lines and displaying an image corresponding to the image data. Here, when the input signal is an image signal for displaying a photographed image or text, the signal controller generates the image data to correspond to a unit frame period composed of frames as weighted image data corresponding to one of the frames, and the display device displays an image corresponding to the weighted image data to have an energy proportional to a number of the frames in the unit frame period.

Display device and driving method thereof

An organic light emitting diode display includes a pixel having a plurality of sub-pixels. Each of the plurality of sub-pixels includes a first sub-pixel having a first anode and a first organic emission layer, a second sub-pixel having a second anode and a second organic emission layer, and a third sub-pixel having a third anode and a third organic emission layer. The first, second, and third anodes satisfy the following condition: where W, W, and Wrespectively denote the width of the first anode, the width of the second anode, and the width of the third anode measured along a direction traversing the first sub-pixel, the second sub-pixel, and the third sub-pixel and where P denotes a width of the pixel measure along the direction traversing the first sub-pixel, the second sub-pixel, and the third sub-pixel.

Organic light emitting diode display for reducing reflection of external light

An OLED display includes a first substrate including a thin film transistor and an organic light emitting element and a second substrate facing the first substrate and having a gully pattern recessed on a surface facing the first substrate. By having the gully pattern on the second substrate, a mechanical strength of the OLED may be improved, and thus, the OLED may minimize the thickness without reducing the mechanical strength.

An OLED display includes: a thin film transistor including a gate electrode, a source electrode, and a drain electrode; a planarization layer on the thin film transistor and including a contact hole at least partially exposing the drain electrode; a pixel electrode on the planarization layer and coupled to the drain electrode of the thin film transistor through the contact hole; a pixel defining layer on the planarization layer and having an opening that exposes the pixel electrode; an organic emission layer on the pixel electrode; and a common electrode on the organic emission layer and the pixel defining layer. The pixel defining layer includes a corner-cube pattern facing the common electrode.

Organic light emitting diode display having improved visibility

A critical dimension controlling method in a semiconductor production process includes determining whether a model is to undergo a discontinuous production process when a run is inserted in a semiconductor manufacturing line, applying an offset for said model or a common offset for a model group including said model according to the determination, executing a production process in dependence upon a process variation along with the offset for the model or the common offset for the model group, and measuring an actual critical dimension in the production process. The offset for the model is calculated based on a previously measured actual critical dimension, and the calculated offset for the model is applied to the calculation of the common offset for the model group.

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Yongin, South Korea

Joo-Hwa Lee