Adv Antest Corporation

Jonh Frediani

Andrew Niemic

Automated test equipment capable of performing a high-speed test of semiconductor devices is presented. The automated test equipment comprises a system controller for controlling a test program, wherein the system controller is coupled to a bus. The tester system further comprises a plurality of modules also coupled to the bus, where each module is operable to test a plurality of DUTs. Each of the modules comprises a tester processor coupled to the bus and a plurality of configurable blocks communicatively coupled to the tester processor. Each of the configurable blocks is operable to communicate with an associated DUT and further operable to be programmed with a communication protocol for communicating test data to and from said associated device under test.

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Corralitos, CA, United States of America

Jonh Frediani