Samsung Electronics Co., Ltd.

Jongseo Park

Ungryeol Lee

Myeonggeun Kim

Nohwan Park

Jaeyup Lee

Sungnam Kim

Yungil Choi

An anechoic antenna chamber includes: a holder on which a device under test (DUT) is configured to be mounted, at least one first antenna configured to radiate a first test signal of a first frequency band, a second antenna provided at an inner side of the antenna chamber and configured to radiate a second test signal of a second frequency, at least one driver configured to rotate the DUT, and a control circuit operatively connected with the at least one first antenna, the second antenna, and the at least one driving part. The control circuit is configured to control the driver to rotate the DUT and control the at least one first antenna to radiate the first test signal having an intensity of a specified range and control the second antenna to radiate the second test signal, while rotating the DUT.

Chamber for measuring performance of antenna, system including the same, and operating method thereof

Provided are an X-ray imaging apparatus, an X-ray detector, and an X-ray imaging system. The X-ray imaging apparatus includes: an X-ray radiation device configured to emit X-rays; a receptor into which a first X-ray detector configured to detect the emitted X-rays is inserted; an X-ray detector sensing interface configured to detect whether the first X-ray detector has been inserted into the receptor, acquire first identification information of the first X-ray detector inserted into the receptor, and generate first position information indicating that the first X-ray detector has been inserted into the receptor; an output interface configured to output information about the first X-ray detector; and a controller configured to control the output interface to output the first position information and the first identification information, wherein the first identification information is identification information set by a workstation of an X-ray imaging system including the X-ray imaging apparatus.

X-ray imaging device, x-ray detector, and x-ray imaging system

Growing community of inventors

Yongin-si, South Korea

Jongseo Park