Samsung Electronics Co., Ltd.

Jongpil Park

Jiyoon Park

Jungeun Lee

Jinho Lim

Chanmin Park

Kihwan Choi

Jea-Muk Oh

Insu Yu

Byungpo Choi

Jaeeun Yang

Sangil Kim

Byoungjun Min

Yunhyeong Kim

An electronic device includes a display, at least one sensor, a processor operatively connected to the display and the at least one sensor, and a memory operatively connected to the processor. The memory stores instructions that, when executed, cause the processor to control the electronic device to obtain a first input associated with generation of a first avatar animation, to obtain first data for a first object based on the obtained first input, to obtain second data for a second object based on the obtained first input and a specified scheme, to generate the first avatar animation based on the first data and the second data, and to display the first avatar animation.

Electronic device for providing avatar animation and method thereof

An electronic device is provided. The electronic device includes a memory, a camera module, and a processor electrically connected to the memory and the camera module. The processor is configured to determine a first exposure value based on a brightness of an external object, sequentially capture a plurality of images using a first exposure value, a second exposure value having an exposure value less than the first exposure value, the first exposure value, and a third exposure value having an exposure value greater than the first exposure value, when a specified condition is satisfied, select a set of continuous images from the plurality of images, and generate a composite image using the set of continuous images.

Method of generating composite image using plurality of images with different exposure values and electronic device supporting the same

A test handler and a test method of a semiconductor device using the same includes a plurality of chambers to provide a sealed inner space accommodating a first tray on which semiconductor devices are mounted, a test module electrically connected to the semiconductor devices in the chambers to perform a test process of the semiconductor devices, and a sort part to load and unload the first tray in the chambers and to sort semiconductor devices determined to be failed in the test process. The plurality of chambers have a fluid path circulating a coolant or a heat medium in the walls so that a temperature of the plurality of chambers is rapidly changed at the test process of the semiconductor devices between a first temperature that is less than room temperature and a second temperature that is greater than room temperature.

Test handler that rapidly transforms temperature and method of testing semiconductor device using the same

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Suwon-si, South Korea

Jongpil Park