Jlk Inspection

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Shin Uk Kang

Myung Jae Lee

Jisoo Son

Tae Won Kim

Dongmin Kim

Dong-Eog Kim

An apparatus for image analysis includes: an image acquisition unit for stacking a plurality of two-dimensional image data in a predetermined order; a three-dimensional image generation unit for generating a plurality of three-dimensional data on the basis of different types of multiple items of information for the plurality of two-dimensional image data in a stacked form from the image acquisition unit; and a deep learning algorithm analysis unit for applying a two-dimensional convolutional neural network to each of the plurality of three-dimensional data from the three-dimensional image generation unit, and combining results of applying the two-dimensional convolutional neural network to the plurality of three-dimensional data.

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Ulsan, South Korea

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