Korea Advanced Institute of Science and Technology

The Wave Talk, Inc.

JongHee Yoon

YongKeun Park

KyeoReh Lee

Young Dug Kim

Nam Kyun Kim

Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Apparatus for detecting sample properties using chaotic wave sensor

An apparatus and method for detecting microbes use laser speckles. The apparatus includes a light source configured to irradiate light into a sample to detect microbes, and a measuring part configured to measure laser speckles, which are formed due to a multiple scattering of the light which is incident into the sample, every reference time and to measure concentration of the microbes contained in the sample based on temporal correlation of the measured laser speckles.

Growing community of inventors

Daejeon, South Korea

JongHee Yoon