Samsung Electronics Co., Ltd.

Lg Innotek Co., Ltd.

Yonsei University

Jiwell Electronics Co., Ltd.

Cheryong Industrial Co., Ltd.

Jong Tae Park

Chanik Park

Hojun Shim

Kangho Roh

Wonmoon Cheon

Yang-sup Lee

Wonhee Cho

Je-Hyuck Song

Moonwook Oh

Youngjoon Choi

Seontaek Kim

Jaesoo Lee

Seung-Duk Cho

Jaehoon Heo

Tae Young Choi

Sungho Hong

Chansol Kim

Jang Gu Oh

Tae Ho Kim

Hyung Jun Kim

Hee Jin Kim

Joon Ho Lee

Kee Ha Hwang

Kyung Seok Hu

Ki Hak Yi

Jae Gi Lee

Jung Yul Cha

Byung Kwon Song

Gyu Hag Kim

The present invention relates to a jawbone distraction system and control method thereof, including a jawbone extension apparatus, a remote controller and a monitor, the jawbone distractor being configured to allow a horizontal shift of alveolar bone as well as performing vertical jawbone distraction, being precisely controlled in a wireless mode and configured to control a drive of the jawbone distractor through the remote controller while ascertaining a driving state by the monitor.

Jawbone distraction system and a control method thereof capable controlling operation using a remote control

A communication method of an application processor includes generating a plurality of files; generating a file set channel by transmitting a first pattern of input/output (I/O) requests to a storage device, the I/O requests being I/O requests corresponding to files from among the plurality of files; and transmitting first bit data to the storage device via the file set channel, the first bit data being transmitted using file set signaling, the file set signaling including a second pattern of I/O requests corresponding to first files from among the plurality of files such that each file in the plurality of files represents a bit of the first bit data.

Electronic device and communication method

A method of repairing a storage device including a non-volatile memory includes powering on the storage device, performing a booting sequence, determining whether an error has occurred during the booting sequence or during a normal mode, writing a failure signature to a predetermined signature address in the non-volatile memory upon determining that the error has occurred, reporting a failure to a host upon writing the failure signature, entering into a repair mode upon reporting the failure, and operating in the normal mode upon determining that the error has not occurred.

Method of repairing non-volatile memory based storage device and method of operating electronic system including the storage device

A memory system is provided with a processor, a main memory, and a flash memory. Performance of the memory system is improved through achievement of speed-up and high data reliability. The memory system includes a nonvolatile memory device and a controller configured to drive a control program to control the nonvolatile memory device. The control program executes a second access operation for the nonvolatile memory device even before a first access operation to the nonvolatile memory device is completed.

Memory system and method of accessing a semiconductor memory device

Disclosed is an apparatus for testing an LED lamp which includes: a secured seat on which the LED lamp is seated; an up and down shifter which, when the LED lamp is seated on the secured seat, shifts from an initial position spaced upward from the LED lamp to a measurement position in which the up and down shifter contacts with a socket of the LED lamp, and which supplies electric power to the LED lamp when the up and down shifter is placed in the measurement position, and a sensor sensing that the up and down shifter is placed in the measurement position; and a quality determining means determining a quality of the LED lamp based on light emitted from the LED lamp, and comprising an illuminometer or a luminance meter.

Testing apparatus and method for testing light emitting diode lamp

Disclosed is a method for operating a test apparatus for an LED lamp. The method includes: forming a self-holding circuit by switching on a first switching means such that an up and down shifter provided in the test apparatus for the LED lamp moves down; moving down and stopping the up and down shifter from a determined initial position to a measurement position; measuring the quality of the LED lamp equipped with the test apparatus for the LED lamp; releasing the self-holding circuit by switching on the second switching means such that the up and down shifter moves up; and moving up and down shifter from the measurement position to the determined initial position.

Testing apparatus for testing light emitting diode lamp and method for operating the same

A manufacturing method of ground-buried-type solid insulation transformer includes producing a coil form into which an inner window is formed; winding a low voltage coil and a high voltage coil on the coil form to produce a first coil part; winding glass fiber on the first coil part to produce a second coil part and assembling a first mold into the inner window and then pre-heating the second coil part; putting the second coil part into a second mold and injecting epoxy resin and hardener between the second coil part and the second mold, and automatically molding and curing thereof under predetermined speed, vacuum, pressure and temperature to produce a third coil part on outer circumference of which an epoxy layer is formed; separating the first mold from the inner window of the third coil part and then after-treating and curing the third coil part; cooling the after-treated and cured third coil part and sanding and washing the epoxy layer, and applying semi-conductive coating material to the sanded part to produce a fourth coil part; assembling a core to the fourth coil part to produce a fifth coil part and testing the fifth coil part; and connecting the fifth coil part to a conductive mesh and shielding thereof, and then sealing outer side of the fifth coil part and filling silicone or high molecular weight compound between the fifth coil part and a shell to manufacturing the transformer.

Method of manufacturing ground-burial type solid insulated transformer

One embodiment of a nonvolatile memory device includes a memory cell array including a plurality of multi-level cells, and a control unit configured to determine a characteristic of data to be stored in the memory cell array. The control unit is configured to select one of plural multi-bit programming methods based on the determination. Data is stored in the memory cell array according to the selected multi-bit programming method, and at least one of the plural multi-bit programming methods maintains least significant bit data when there is a program fail of most significant bit data.

Growing community of inventors

Hwaseong-si, South Korea

Jong Tae Park