Skhynix Inc.

Jong Seok Jung

Chan Keun Kwon

Young Kwan Lee

Jong Seok Kim

Suk Hwan Choi

Sung Won Choi

Sun Beom Lee

Kyeong Hwan Park

A semiconductor device includes a sensing voltage line disposed between a first circuit area and a second circuit area, and configured to transfer a sensing voltage detected in the second circuit area to the first circuit area; and a first internal voltage line disposed between the first circuit area and the second circuit area, configured to transfer an internal voltage, generated by a voltage driver of the first circuit area using the sensing voltage provided through the sensing voltage line, to the second circuit area and configured to shield the sensing voltage line.

Semiconductor device having shielding structure

A leakage current detection circuit includes: a mirror circuit configured to copy a leakage current flowing through a node and generate a copy current in a copy node; an oscillation circuit including a charge storage unit, the oscillation circuit being connected to the copy node, charged with the copy current, and configured to generate an oscillation signal by charging and discharging the charge storage unit; and a calculation circuit configured to calculate an amount of the leakage current based on the oscillation signal.

Leakage current detection circuit

A test circuit of a semiconductor apparatus includes a first resistor, a second resistor and a feed-back loop circuit. The first resistor is coupled between a pad and a test element. The second resistor is coupled to the first resistor in a parallel manner. The feed-back loop circuit is configured to feed a result back to the second resistor, the result being one of comparing a first voltage and a second voltage with each other, the first voltage and the second voltage being applied respectively to the first resistor and the second resistor.

Test circuit of semiconductor apparatus and test system including the same

A bandgap reference circuit includes a plurality of current sources including different temperature coefficients, a first trimmer, and a mixer. The first trimmer adjusts current amounts for a plurality of currents, which are individually output from each of the plurality of current sources, to be equal to each other. The mixer adjusts an aggregate ratio and combines the plurality of currents based on the aggregate ratio.

Semiconductor device for generating a reference current or voltage in various temperatures

A test circuit includes a control circuit and a counting circuit. The control circuit is configured to control a charging operation and a discharging operation on a test node. The counting circuit is configured to generate counting information by performing a counting operation during a unit measurement interval.

Test circuit and semiconductor memory system including the test circuit

A power generation device includes a band gap reference (BGR) circuit configured to generate a reference voltage independent of an environmental change, and a voltage generation circuit configured to transfer an input power voltage based on a sum of the reference voltage and an internal ground voltage to generate an internal power voltage.

Apparatus and method for stabilizing power in a semiconductor device

There are provided an oscillator and a memory system including the same. In the oscillator including an odd number of inverters sequentially coupled, in which an output signal of an inverter of a last stage is fed back as an input signal of an inverter of a first stage, wherein each of the inverters includes: a first input signal control unit configured to delay an input signal of each of the inverters by a first delay time or a second delay time and output a first delay input signal; a second input signal control unit configured to delay the input signal by a third delay time or a fourth delay time and output a second delay input signal; and a signal output unit configured to an output signal in response to the first delay input signal and the second delay input signal.

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Gyeonggi-do, South Korea

Jong Seok Jung