Skhynix Inc.

Hynix Semiconductor Inc.

Industry-University Cooperation Foundation Hanyang University

Jong-Man Im

Yu-Ri Lim

Jae-Jin Lee

Chun-Seok Jeong

Kae-Dal Kwack

Jun-Cheol Park

Myoung-Jun Chai

Joong-Sik Kih

Jae-Woong Choi

A semiconductor device includes a period defining block suitable for generating a period defining signal corresponding to a predetermined test time period based on a test mode signal and one or more command signals; and a monitoring block suitable for generating a monitoring signal corresponding to an oscillation signal during the test time period based on the period defining signal.

Semiconductor device

A semiconductor device includes a voltage adjust circuit suitable for generating an adjusting voltage according to a counting signal; an oscillating circuit operable by an oscillating control signal, and suitable for outputting an operational clock signal whose frequency is controlled by the adjusting voltage; a pumping circuit suitable for generating an internal voltage by pumping a source voltage according to the operational clock signal; and a counting circuit suitable for generating the counting signal by counting the operational clock signal according to the oscillating control signal.

Semiconductor device and semiconductor system for detecting voltage-drop level

A semiconductor device includes: an internal voltage generation block suitable for generating an internal voltage based on first and second external voltages whose power-up sections are different from each other; and a control block suitable for fixing the internal voltage to a predetermined voltage level during a control section including a first power-up section of the first external voltage and a second power-up section of the second external voltage.

Semiconductor device and method of driving the same

A semiconductor device includes: a unit configured to, in a period before power up, compare a voltage obtained by dividing a voltage of a first voltage node at a first division ratio with a voltage obtained by dividing a voltage of a second voltage node at a second division ratio and determine whether to activate an enable signal according to a result of the comparison; and a voltage driving unit configured to increase the voltage of the second voltage node when the enable signal is activated in the period before power up.

A temperature sensing circuit includes a temperature-dependent voltage generating block configured to generate a plurality temperature-dependent voltages having voltage levels that are changed according to temperature; and a comparing block configured to compare each voltage level of the temperature-dependent voltages with a voltage level of a predetermined voltage to output thermal codes.

Temperature sensing circuit

An on-die thermal sensor includes an integrating analog-digital converter not requiring a negative reference voltage input. The on die thermal sensor includes a band gap unit, an integrating unit and a counting unit. The band gap unit senses a temperature to output a first voltage corresponding to the sensed temperature. The integrating unit integrates a difference between a reference voltage and a comparing voltage to output a second voltage wherein the comparing voltage has a voltage level higher than that of the reference voltage. The counting unit counts clocks of a clock signal input thereto until the second voltage reaches the first voltage, thereby outputting a thermal code corresponding to the voltage level of the first voltage.

Growing community of inventors

Gyeonggi-do, South Korea

Jong-Man Im