Samsung Electronics Co., Ltd.

Jong-Hak Won

Soo-Young Kim

Jung-Hyeon Kim

Young-Soo An

Hak-soo Yu

Hyang-Ja Yang

Choong-Sun Shin

Hak-Soo Yoo

A method for forming a unit layout pattern includes: forming first through third active regions in the unit layout pattern, each of the first through third active regions aligning and extending along a length in a first direction and having a width in a second direction perpendicular to the first direction; forming first and second gate regions on the first and second active regions, the first and second gate regions electrically connected to each other; forming the first active region of a first conductive type within a second conductive type well region; forming the second active region of a second conductive type; and forming the third active region connected with the first and second gate regions to form a junction diode, the third active region being located between the first or the second active region and an end of the length in the first direction of the unit pattern.

Layout method of semiconductor device with junction diode for preventing damage due to plasma charge

A data line layout includes column selection lines arranged in a first direction at a layer on a memory cell array region, and data lines arranged in the first direction at the layer, the data lines being connected between I/O sense amplifiers and I/O pads.

Area-efficient data line layouts to suppress the degradation of electrical characteristics

A layout method of junction diodes for preventing damage caused by plasma charge includes forming an active layer to form a plurality of active regions in a unit layout pattern; forming a gate layer to form a plurality of gate regions on the active regions; forming a first conductive type doping region in at least one of the plurality of active regions within a well layer where a second conductive type well region is formed to form a first conductive type active region; forming a second conductive type doping region in at least one of the plurality of active regions outside of the second conductive type well region to form a second conductive type active region; and forming a second conductive type doping region connected with the gate regions to form a junction diode in at least one active region between the first and second conductive type active regions.

Provided is a layout method of junction diodes for preventing damage caused by plasma charge. The layout method includes operations of forming an active layer so as to form a plurality of active regions in a unit layout pattern; forming a gate layer so as to form a plurality of gate regions on the active regions; forming a first conductive type doping region in at least one of the plurality of active regions within a well layer where a second conductive type well region is formed so as to form a first conductive type active region; forming a second conductive type doping region in at least one of the plurality of active regions outside of the second conductive type well region so as to form a second conductive type active region; and forming a second conductive type doping region connected with the gate regions so as to form a junction diode in at least one active region between the first and second conductive type active regions.

A semiconductor memory device includes a sub memory cell array region having memory cells each connected between word lines extending in a first direction and bit lines extending in a second direction that is orthogonal to the first direction of extension of the word lines and a sub word line driver region disposed at a side of the sub memory cell array region in the first direction and including sub word line drivers that activate the word lines. A sensing region is disposed at a side of the sub memory cell array region in the second direction and including an equalizer that precharges the bit line in response to a signal transferred through a drive signal line and at least one first control signal driver that activates an inverted control signal line in response to a signal transferred through a control signal line. A conjunction region disposed at an intersection between the sub word line driver region and the sensing region, in which the inverted control signal line is connected to the drive signal line.

Semiconductor memory device

A layout structure of a bit line sense amplifier is provided. According to an embodiment of the present invention, the layout structure of the bit line amplifier of a semiconductor memory device includes memory blocks structured by a plurality of cells, bit line pairs connected to the cells and a plurality of bit line sense amplifier blocks for sensing data of the cells, wherein each of the bit line sense amplifier blocks comprises: PMOS sense amplifier structured by first and second PMOS transistors; NMOS sense amplifier structured by first and second NMOS transistors; an IO line pair structured by an IO line and an IO bar line, which are placed between the PMOS sense amplifier and the NMOS sense amplifier; and a first IO switch and a second IO switch, which are connected to one of the bit line pair and the IO line pair, wherein a gate region of the first PMOS transistor, a gate region of the first NMOS transistor and the first IO switch are respectively arranged at a gate region of the second PMOS transistor, a gate region of the second NMOS transistor and the second IO switch in one direction only at predetermined spaces &#x394;P, &#x394;N and &#x394;I.

Layout structure of bit line sense amplifier of semiconductor memory device

The present invention discloses a semiconductor memory device and a method of signal line arrangement. The semiconductor memory device comprises a plurality of memory cell array blocks, a number of pairs of local data input/output lines arranged along a longitudinal direction in each of the memory cell array blocks, multiple column selecting signal lines arranged along an orthogonal direction, and a number of twisted pairs of global data input/output lines arranged adjacent to and along the same direction as the column selecting signal line. Therefore, reducing signal coupling among the column selecting signal line and the pair of global data input/output lines.

Semiconductor memory device and signal line arrangement method thereof

A method of controlling the buffering of output data by synchronizing with an external system clock, including the steps of generating an internal clock pulse, transferring data from a chip to a pair of data output lines in response to the internal clock pulse, generating an output mode control signal in synchronism with the internal clock pulse, gating the output mode control signal from the first edge of the internal clock pulse to the first edge of the next internal clock pulse to produce an output control signal, and driving data output to an output pad in response to the output control signal is disclosed. A data output buffer control apparatus of a synchronous semiconductor memory device operating in synchronism with an externally applied system clock pulse is also disclosed, which apparatus has an internal clock pulse generator for generating an internal clock pulse in response to the system clock pulse, an output register for transmitting data from the inside of the chip to a pair of data output lines in synchronism with the first edge of the system clock pulse, an output mode control signal generator for generating a predetermined output mode control signal in synchronism with the system clock pulse, an output buffer control means for gating the output mode control signal from the first edge to the second edge of an internal clock pulse to create an output control signal, and a data output means for driving the output of the output register in response to the output control signal of the output buffer control means.

Growing community of inventors

Gyeonggi-do, South Korea

Jong-Hak Won