Samsung Electronics Co., Ltd.

Jong-Cheol Seo

Young-Man Ahn

Jung-Kuk Lee

Seung-Jin Seo

Seung-Man Shin

Soon-Deok Jang

Seung-Hee Mun

A memory module and related method are disclosed. The memory module comprises a clock generator configured to generate first and second internal clock signals in relation to an external clock signal, and a register configured to receive the first and second internal clock signals. The register stores an external control/address signal in response to the first internal clock signal and transmits an internal control/address signal derived from the external control/address in response to the second internal control/address signal.

Memory system with registered memory module and control method

A test board for a high-frequency system level test: The test board includes a main board having through holes filled with a conductive material. These holes may be located at a portion of the main board from which an existing module socket has been removed. An interface board has surface mounted device (SMD) pads on front and rear surfaces. The SMD pads on the front surface of the interface board are connected with the SMD pads on the rear surface thereof through cross connection wiring within the interface board for a pin swap. The through holes of the main board are connected with the SMD pads on the rear surface of the interface board via iron cores fixed at a guide. A test module socket is mounted on surfaces of the SMD pads on the front surface of the interface board.

Test board for high-frequency system level test

Growing community of inventors

Yongin-si, South Korea

Jong-Cheol Seo