Lockheed Martin Corporation

Jonathan Todd

Sreerupa Das

Amar Patel

Steven McNamara

Mechanisms for generating an analysis result about a machine are provided. A device generates a first health management (HM) analysis result regarding a machine based on real-time first sensor information received during a first period of time and on a first version HM analytic model. The device provides, to an off-board device, a plurality of sensor information comprising the real-time first sensor information and that is generated during the first period of time. The device receives a second version HM analytic model that is based at least in part on the plurality of sensor information and fault information that identifies actual faults that have occurred on the machine. The device generates a second HM analysis result regarding the machine based on real-time second sensor information received during a second period of time and on the second version HM analytic model.

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Cocoa, FL, United States of America

Jonathan Todd