Freescale Semiconductor,inc.

Jonathan M Phillippe

James W Miller

Robert Scott Ruth

Melanie Etherton

Mohamed S Moosa

Alex P Gerdemann

Gilford E Lubbers

Chris J Micielli

Alexey Gilgur

An integrated circuit includes a plurality of I/O cells, each including a portion of the first power bus, a portion of the second power bus, and an I/O pad coupled between the portions of the first and second power buses. A first set of the plurality of I/O cells is arranged along a die edge of the integrated circuit. A second set of the plurality of I/O cells is arranged along the die edge between the first set and the die edge. For each I/O cell in the first set, the portion of the first power bus is physically connected to the portion of the first power bus of an abutting I/O cell of the second set at a boundary between the I/O cell of the first set and the abutting I/O cell of the second set. The integrated circuit includes an ESD clamp and a trigger circuit.

Electrostatic discharge protection system

A low voltage differential signaling generating circuit, which comprises a current source a pair of output nodes for providing a differential signal by virtue of a voltage difference therebetween, first and second differential switch circuitries and a bypass circuitry. The first differential switch circuitry selectively connects the current source to the first output node based on a control signal to cause a current flow from the first output node to the second one. The second differential switch circuitry selectively connects the current source to the second output node based on the control signal to cause a current flow from the second output node to the first one. The bypass circuitry is arranged in parallel to the first and second differential switch circuitries and is selectively switched based on an idle mode signal to prevent a current between the output nodes.

LVDS with idle state

An integrated circuit including an ESD network including a portion located in ESD subareas of a plurality of I/O cells where the ESD subareas are arranged in a row traversing the plurality of I/O cells. The ESD network includes ESD clamp cells and ESD trigger circuit cells wherein a portion of the network is located in the row. In some examples, the row includes an ESD trigger circuit cell with a portion in one subarea of one ESD subarea of one I/O cell and a second portion in a second ESD subarea of another I/O cell. Also described herein is a method for producing an integrated circuit layout with an ESD network.

I/O cell ESD system

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Austin, TX, United States of America

Jonathan M Phillippe