Teradyne, Inc.

Jonathan M Hops

Brian C Phelps

John Robert Pane

Bruce D Sudweeks

Brian G Swing

James E Kinslow, Jr

Jacob S Scherb

A method and system is provided for detecting and correcting non-deterministic data that provides substantially real-time validation results and maximizes flexibility for the device manufacturer while reducing test costs. The automatic test apparatus and method can correct non-determinism caused by cycle slipping at the beginning of data transmission, between packets of data being transmitted and out-of-order data types of non-determinism. A data validation circuit is coupled to the receiver for validating the packet data based on expected packet data stored in a vector memory.

Apparatus and method for testing non-deterministic device data

A method for testing semiconductor devices that output non-deterministic entity information such as packet and control signals is disclosed. The method includes the steps generating test signals with a semiconductor tester and applying the generated test signals to the device-under-test. Actual output entities from the DUT in response to the applied generated test signals are captured by the tester and compared to expected output entities. If a failure is identified in the comparing step, the method defines a window of valid expected entities and compares the failed actual output entity to the window of valid expected entities. If a match occurs between the failed actual output entity and any of the expected entities in the window, the actual entity is deemed valid.

Method for testing non-deterministic device data

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Thousand Oaks, CA, United States of America

Jonathan M Hops