Leco Corporation

Jonathan Jaloszynski

Peter Markel Willis

A time-of-flight mass spectrometer (TOF MS) comprises a mass analyzer, an ion pushing device, a filtering device, a multi-pass reflector, a detector, and a decoder. The ion pushing device is arranged to push ions into the mass analyzer. The filtering device is arranged to filter a portion of the ions based on a mass range of the ions. The multi-pass reflector is arranged to selectively reflect the ions for further passes through the mass analyzer. The detector is arranged to receive the ions. The decoder is arranged to reconstruct a mass spectrum for the entire mass range of the ions.

Methods and systems for multi-pass encoded frequency pushing

Implementations of methods and apparatuses are disclosed for decoding multiplexed information in a chromatographic system. Implementations may include the method of pulsing ions from an ion source through an analyzer according to a predetermined multiplexing scheme, each pulse including one or more ions corresponding to a sample, detecting a plurality of ion strikes at a detector, determining a data point for each ion strike, wherein each data point includes an intensity of a detected ion strike and a time of the detected ion strike, maintaining a multiplexed spectrum of the data points, the multiplexed spectrum including the data points, and demultiplexing the time shifted spectrum using the data points of the multiplexed spectrum.

Method and apparatus for decoding multiplexed information in a chromatographic system

A method of correcting time-of-flight drift in a mass spectrometer by identifying mass spectral peaks of ions in spectra, detecting ions having substantially the same mass across spectra, determining a time-of-flight drift of the detected ions, and correcting the time-of-flight drift of the detected ions by applying a correction factor to each respective time-of-flight.

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Saint Joseph, MI, United States of America

Jonathan Jaloszynski