National Technology & Engineering Solutions of Sandia, LLC

Jonathan David Sterk

Paul J Resnick

Christopher Nordquist

Matthew G Blain

Jongmin Lee

Bradley C Salzbrenner

Christopher W Berry

Daniel L Stick

Peter Lukas Wilhelm Maunz

Lambert Paul Parazzoli

Todd Andrew Barrick

Jeffrey D Hunker

John F Rembetski

Adrian Samuel Orozco

Weng W Chow

Brian Mcfarland

Ryan J Law

A compact convertible single pass (SP)/double pass (DP) optical system is disclosed. The convertible optical system is convertible in the sense that the optical system can be configured to have any one of multiple configurations, including SP/DP, DP/SP, just SP, or just DP. This flexibility in the configuration is made possible by a compact baseplate with various predefined mounting points for the various optical elements required for the different configurations. Further, there is significant commonality among the optical elements required to implement the various configurations. For this reason, if one is cost constrained, one can start with the compact baseplate and populate it with the optical elements required for either the SP or DP configuration and later add the optical elements required to create the SP/DP or DP/SP configuration as funding permits.

Compact convertible universal single pass/double pass optical system

A large-dynamic and high-sensitive measurement protocol of an evanescent-field-mode guided atom interferometer accelerometer is disclosed. Cold atoms of a finite temperature are one-dimensionally guided in an evanescent field optical dipole trap. The first-step pathfinder protocol employs the revival of atomic coherence, i.e., the recovery of atomic fringe visibility to capture global interferometric signature to provide the information (e.g., a large-range of approximate acceleration sensing) to optimize the physical parameters for the second-step high-precision guided LPAI measurement. The contrast of atomic fringe visibility returns to unity given a specific interrogation time during the pulse sequence. To ensure the optimal interrogation time, the method employs a time-scanning sequence about the anticipated optimal interrogation time. The anticipated optimal interrogation time is determined via a conventional inertial measurement unit co-sensor or through the use of a look-up table. The method may alternatively employ a phase-scanning sequence.

Measurement protocol for large dynamic range and high sensitivity of an evanescent-field-mode guided atom interferometer

A platform for trapping atomic ions includes a substrate and a plurality of metallization layers that overlie the substrate. The metallization layer farthest from the substrate is a top layer patterned with electrostatic control trap electrodes and radio-frequency trap electrodes. Another metallization layer is a microwave layer patterned to define a microwave circuit. The microwave layer lies below the top layer. The microwave circuit is adapted to generate, in use, a microwave magnetic field above the electrostatic control and radio-frequency trap electrodes. The top metallization layer includes slots that, in use, are penetrated by microwave energy from the microwave circuit.

Ion trapping for quantum information processing

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Albuquerque, NM, United States of America

Jonathan David Sterk