Google Inc.

Nanotronics Imaging, Inc.

Other

Cresilon, Inc.

Jonathan David Lee

John B Putman

Matthew C Putman

Damas Limoge

John Nicholas Jitkoff

Jonathan Jarvis

Jean-Marc Denis

Erik Viktor Persson

Richard Ngo

Michael Moskie

Rick Jones

Adam Grabowski

Viktor Persson

Andy Gugel

Jesse Kaczmarek

Adrian Zumbrunnen

Cliff Kuang

Behshad Behzadi

Zaheed Sabur

Daniel Cotting

Lucas Mirelmann

Denis Burakov

Sergey Nazarov

Michael Golikov

Steve Cheng

Mario Bertschler

Bohdan Vlasyuk

Denis Y Sharoukhov

Tonislav Ivanov

Lucia Terrenghi

Anuj Doshi

Andrew Gugel

Zachary Gibson

Valerie Bordelanne

Bethany Fong

Sarah Constantin

Matthew Ryan Casey

Richard Eugene Fulcher

Tak Keung Cheng

Joseph A Landolina

Matthew Swift

Omar M Ahmad

James O'Leary

J T DiMartile

Daniel Kamhaji

Erin Lynch

Patrick Schmidt

A manufacturing system is disclosed herein. The manufacturing system includes a monitoring platform and an analytics platform. The monitoring platform is configured to capture data of an operator during assembly of an article of manufacture. The monitoring platform includes one or more cameras and one or more microphones. The analytics platform is in communication with the monitoring platform. The analytics platform is configured to analyze the data captured by the monitoring platform.

Artificial intelligence process control for assembly processes

Implementations set forth herein relate to an automated assistant that can proactively identify and complete tasks that may be associated with an activity with which a user has scheduled the automated assistant to assist with. The tasks can be identified and completed prior to a time that the user has scheduled the automated assistant to assist the user, thereby eliminating certain manual tasks the user may otherwise perform at the scheduled time. When the activity involves communicating with a separate entity, such as another person and/or organization, the automated assistant can initialize communication with the entity prior to the scheduled time that the user requested assistance. A customized GUI can be rendered at an assistant-enabled device to provide the user with an ongoing status of completing various tasks associated with scheduled activity.

Assistant adaptation of graphical user interface to guide interaction with user in fulfilling user request

Implementations can reduce the time required to obtain responses from an automated assistant by, for example, obviating the need to provide an explicit invocation to the automated assistant, such as by saying a hot-word/phrase or performing a specific user input, prior to speaking a command or query. In addition, the automated assistant can optionally receive, understand, and/or respond to the command or query without communicating with a server, thereby further reducing the time in which a response can be provided. Implementations only selectively initiate on-device speech recognition responsive to determining one or more condition(s) are satisfied. Further, in some implementations, on-device NLU, on-device fulfillment, and/or resulting execution occur only responsive to determining, based on recognized text form the on-device speech recognition, that such further processing should occur. Thus, through selective activation of on-device speech processing, and/or selective activation of on-device NLU and/or on-device fulfillment, various client device resources are conserved.

Selectively activating on-device speech recognition, and using recognized text in selectively activating on-device NLU and/or on-device fulfillment

A computing system receives, from an image sensor, at least two images of a specimen positioned on a specimen stage of a microscope system. The computing system provides the at least two images to an autofocus model for detecting at least one distances to a focal plane of the specimen. The computing system identifies, via the autofocus model, the at least one distance to the focal plane of the specimen. Based on the identifying, the computing system automatically adjusts a position of the specimen stage with respect to an objective lens of the microscope system.

Deep learning model for auto-focusing microscope systems

A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an annotated image from the user. The user annotated the image using an input via the device. The input includes a first indication of a location of the defect and a second indication of a class corresponding to the defect. The computing system adjusts the annotated image to standardize the input based on an error profile of the user and the class corresponding to the defect. The computing system uploads the annotated image for training the machine learning model.

System and method for generating training data sets for specimen defect detection

Implementations set forth herein relate to providing notifications regarding events that may interrupt content being rendered at an interface. The notifications can be preemptive and/or can indicate a predicted time and/or source for the events. The event can be, for example, a person attempting to contact a user who is viewing content at a display interface. The person can be associated with a food delivery that has been ordered by the user via a delivery application. An application, such an automated assistant application, can predict when the person is expected to arrive with the food delivery, and generate a notification ahead of the person arriving. In some implementations, the notification can be rendered at a scrubber user interface (UI) at a location corresponding to the time that the food delivery is expected to arrive, thereby putting the user on notice of when the streaming content may be interrupted.

Generating notifications that provide context for predicted content interruptions

A deep learning process receives desired process values associated with the one or more process stations. The deep learning processor receives desired target values for one or more key performance indicators of the manufacturing process. The deep learning processor simulates the manufacturing process to generate expected process values and expected target values for the one or more key performance indicators to optimize the one or more key performance indicators. The simulating includes generating a proposed state change of at least one processing parameter of the initial set of processing parameters. The deep learning processor determines that expected process values and the expected target values are within an acceptable limit of the desired process values and the desired target values. Based on the determining, the deep learning processes causes a change to the initial set of processing parameters based on the proposed state change.

Threshold determination for predictive process control of factory processes, equipment and automated systems

A microscopy system and method of focusing the same are disclosed herein. The microscopy system may include an objective, and imaging device, an illumination source, an epi-illumination module, and a controller. The imaging device is configured to capture a single image of a specimen positioned on a stage of the microscopy system. The illumination source is configured to illuminate the specimen positioned on the stage. The epi-illumination module includes a focusing mechanism in a first primary optical path of a light generated by the illumination source. The focusing mechanism is tilted in relation to a plane perpendicular to the first primary optical path. The controller is in communication with the illumination source. The controller is configured to focus the microscopy system based on a pattern produced by the focusing mechanism on the single image captured by the imaging device.

Autofocus system and method

Embodiments disclosed herein are generally related to a system for noise reduction in low signal to noise ratio imaging conditions. A computing system obtains a set of images of a specimen. The set of images includes at least two images of the specimen. The computing system inputs the set of images of the specimen into a trained denoising model. The trained denoising model is configured to output a single denoised image of the specimen. The computing system receives, as output from the trained denoising model, a single denoised image of the specimen.

Deep learning model for noise reduction in low SNR imaging conditions

Implementations set forth herein relate to an automated assistant that can be invoked while a user is interfacing with a foreground application in order to retrieve data from one or more different applications, and then provide the retrieved data to the foreground application. A user can invoke the automated assistant while operating the foreground application by providing a spoken utterance, and the automated assistant can select one or more other applications to query based on content of the spoken utterance. Application data collected by the automated assistant from the one or more other applications can then be used to provide an input to the foreground application. In this way, the user can bypass switching between applications in the foreground in order to retrieve data that has been generated by other applications.

Automated assistant for generating, in response to a request from a user, application input content using application data from other sources

An inspection apparatus includes a specimen stage configured to retain a specimen, at least three imaging devices arranged in a triangular array positioned above the specimen stage, each of the at least three imaging devices configured to capture an image of the specimen, one or more sets of lights positioned between the specimen stage and the at least three imaging devices, and a control system in communication with the at least three imaging devices.

System, method and apparatus for macroscopic inspection of reflective specimens

A training set that includes at least two data types corresponding to operations and control of a manufacturing process is obtained. A deep learning processor is trained to predict expected characteristics of output control signals that correspond with one or more corresponding input operating instructions. A first input operating instruction is received from a first signal splitter. A first output control signal is received from a second signal splitter. The deep learning processor correlates the first input operating instruction and the first output control signal. Based on the correlating, the deep learning processor determines that the first output control signal is not within a range of expected values based on the first input operating instruction. Responsive to the determining, an indication of an anomalous activity is provided as a result of detection of the anomalous activity in the manufacturing process.

Dynamic monitoring and securing of factory processes, equipment and automated systems

A system is disclosed herein. The system includes a splitter board. The splitter board includes a microprocessor, a converter, and a bypass relay. The converter includes analog-to-digital circuitry and digital-to-analog circuitry. The bypass relay is configurable between a first state and a second state. In the first state, the bypass relay is configured to direct an input signal to the converter. The converter converts the input signal to a converted input signal and splits the converted input signal into a first portion and a second portion. The first portion is directed to the microprocessor. The second portion is directed to an output port of the splitter board for downstream processes. In the second state, the bypass relay is configured to cause the input signal to bypass the converter. The bypass relay directs the input signal to the output port of the splitter board for the downstream processes.

Fault protected signal splitter apparatus

A simulated process is initiated. The simulated process includes generating, by an emulator, a control signal based on external inputs. The simulated process further includes processing, by a simulator, the control signal to generate simulated response data. The simulated process further includes generating, by a deep learning processor, expected behavioral pattern data based on the simulated response data. An actual process is initiated by initializing setpoints for a process station in a manufacturing system. The actual process includes generating, by the deep learning processor, actual behavioral pattern data based on actual process data from the at least one process station. The deep learning processor compares the expected behavioral pattern to the actual behavioral pattern. Based on the comparing, the deep learning processor determines that anomalous activity is present in the manufacturing system. Based on the anomalous activity being present, the deep learning processor initiates an alert protocol.

Method, systems and apparatus for intelligently emulating factory control systems and simulating response data

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Brooklyn, NY, United States of America

Jonathan David Lee