Growing community of inventors

Tucson, AZ, United States of America

Jonathan D Ellis

Average Co-Inventor Count = 2.86

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 5

Jonathan D EllisWayne Harvey Knox (2 patents)Jonathan D EllisLeonard Zheleznyak (2 patents)Jonathan D EllisSam C Butler (2 patents)Jonathan D EllisTheodore Foos (2 patents)Jonathan D EllisDaniel R Brooks (2 patents)Jonathan D EllisKrystel R Huxlin (1 patent)Jonathan D EllisKaitlin T Wozniak (1 patent)Jonathan D EllisJosephus Wilhelmus Spronck (1 patent)Jonathan D EllisCory Leeson (1 patent)Jonathan D EllisCorey Leeson (1 patent)Jonathan D EllisJonathan D Ellis (6 patents)Wayne Harvey KnoxWayne Harvey Knox (104 patents)Leonard ZheleznyakLeonard Zheleznyak (17 patents)Sam C ButlerSam C Butler (2 patents)Theodore FoosTheodore Foos (2 patents)Daniel R BrooksDaniel R Brooks (2 patents)Krystel R HuxlinKrystel R Huxlin (12 patents)Kaitlin T WozniakKaitlin T Wozniak (2 patents)Josephus Wilhelmus SpronckJosephus Wilhelmus Spronck (2 patents)Cory LeesonCory Leeson (1 patent)Corey LeesonCorey Leeson (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. University of Rochester (6 from 971 patents)

2. Clerio Vision, Inc. (2 from 8 patents)

3. Arizona Board of Regents on Behalf of the University of Arizona (1 from 972 patents)

4. Delft University of Technoloty (1 from 6 patents)


6 patents:

1. 11845143 - Optical design for a two-degree-of-freedom scanning system with a curved sample plane

2. 11833081 - Vision correction with laser refractive index changes

3. 11571336 - Refractive index shaping laser writing process control

4. 11369515 - Vision correction with laser refractive index changes

5. 10399292 - High numerical aperture optomechanical scanner for layered gradient index microlenses, methods, and applications

6. 9518816 - Dual beam splitter interferometer measuring 3 degrees of freedom, system and method of use

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as of
12/7/2025
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