Symbol Technologies, LLC

Jonathan Chin

David P Goren

Christopher Warren Brock

Christopher J Fjellstad

Patrick Mauro

Michael Steele

David Tsi-Shi

An imaging system with in-field image quality testing and reporting features, includes a housing, and a solid-state imager having an array of image sensors supported by the housing for capturing return light from a target located in a range of working distances from the housing in an image capture mode of operation, and for capturing return light from a test pattern positioned at a predetermined position in the range of working distances in a test mode of operation different from the image capture mode. An electrical signal indicative of the captured return light is generated in each mode. A memory is supported by the housing for storing a test program for testing image quality. A controller is supported by the housing for processing the electrical signal in the image capture mode, and for accessing the memory to enable the controller to execute the test program in the test mode to test the image quality of the test pattern imaged by the imaging system, and for reporting test results of the image quality of the test pattern.

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North Babylon, NY, United States of America

Jonathan Chin