Polymer Technology Systems, Inc.

Jonathan A Broadwell

Christopher Dailey

Donnie Smith

Steven Zucker

James Miller

In one embodiment, a system for a configurable meter for analyte testing includes a meter, the meter configured to respond to commands in a first protocol and thereby control an analysis system for detecting an analyte level of an analyte, a display, and an input device. The system further includes a removable chip insertable into the meter, the removable chip configured to execute a protocol when mated with the meter and send the commands in the first protocol to control the meter, the removable chip further configured to calculate the analyte level as part of the protocol.

Systems and methods for meter reconfiguration, control, and operation via an insertable chip with microprocessor

In one embodiment, a system for determining the proper positioning of a test strip includes a test strip having a first reading window and a strip holder. The system further includes a meter, the meter receiving and configured to receive the test strip, the meter having a first light source of a first color and a second light source of a second color and a first read window. The meter is configured to illuminate the first light source; detect a first reflectance with the meter through the first read window; and determine if the first reflectance is greater than a no-strip value.

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Beech Grove, IN, United States of America

Jonathan A Broadwell