Other

Jon Udell

Janusz Rajski

Mark A Kassab

Chen Wang

As described herein, circuit testing algorithms, or portions thereof, can be executed in a distributed manner so that their execution can be over a network of processors. In one aspect, the results that are obtained by such distributed execution are ensured to be consistent with the results that would be obtained by executing them in a non-distributed manner. Thus, in one aspect, the algorithms, or portions thereof, have to be made distributable. The algorithms, or portions thereof, are made distributable by isolating any random number generation therewith to be independent of each other. This isolation applies to any random number generation associated with different call instances of the same algorithm as well. In one aspect, the isolation is accomplished by ensuring that the calculation of random number sequences for the algorithms, or portions thereof, is not dependent on random number sequences calculated for the others or between call instances of the same algorithm.

Methods for distribution of test generation programs

Described herein are methods and systems for distributed execution of circuit testing algorithms, or portions thereof. Distributed processing can result in faster processing. Algorithms or portions of algorithms that are independent from each other can be executed in a non-sequential manner (e.g., parallel) over a network of plurality of processors. The network includes a controlling processor that can allocate tasks to other processors and conduct the execution of some tasks on its own. Dependent algorithms, or portions thereof, can be performed on the controlling processor or one of the controlled processors in a sequential manner. For algorithms that are highly sequential in nature, portions of algorithms can be modified to delay the need for dependent results between algorithm portions by creating a rolling window of independent tasks that is iterated.

Methods for distributing programs for generating test data

Circuit test algorithms, or portions thereof, can be executed in a non-sequential manner over a network comprising a plurality of processors. Such distributed processing can improve the speed with which results are obtained and processed. Circuit testing algorithms can include, but are not limited to, test pattern generation algorithms and fault simulation algorithms. Those algorithms that are independent from each other can be executed non-sequentially (e.g., in parallel). Allocation of the various algorithm portions for execution among various processors can be based in part on a queue length associated with the processor. The queue length is adjustable based on many factors including data indicating the status of an execution maintained by the controlled processors. The faster processors can have their queue lengths increased. Multiple queue lengths can be maintained to allow for changes in allocation based on the granularity of tasks being performed by the controlling processor.

Queuing methods for distributing programs for producing test data

Described herein are methods and systems for distributed execution of circuit testing algorithms, or portions thereof. Distributed processing can result in faster processing. Algorithms or portions of algorithms that are independent from each other can be executed in a non-sequential manner (e.g., parallel) over a network of plurality of processors. The network includes a controlling processor that can allocate tasks to other processors and conduct the execution of some tasks on its own. Dependent algorithms, or portions thereof, can be performed on the controlling processor or one of the controlled processors in a sequential manner.

Growing community of inventors

West Linn, OR, United States of America

Jon Udell