Harris Corporation

Jon Tower

Barry G Grossman

Lendon L Bendix

Mathew M Kincaid

Systems () and methods () for measuring geometric changes of a passive material () when heat and pressure are applied thereto. The methods involve forming a pad () on a passive material panel (). The pad includes at least one of a layer of a passive material () and a layer of a metal (). The methods also involve coupling an interferometer () to the pad. The method also involves forming a multi-layer structure by placing at least one substrate panel () on top of the passive material such that an aperture () formed in the substrate panel is aligned with the pad. Pressure and heat are applied to the multi-layer structure. Data is collected using the interferometer while the pressure and heat are applied to the multi-layer structure. The interferometer can include, but is not limited to, a Fabry-Perot interferometer, a Michelson interferometer and/or a Mach-Zehnder interferometer.

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Jon Tower