U.S. Natural Resources, Inc.

Weyerhaeuser Company Limited

Jon F Soest

Peter C Matthews

James N Horn

Gordon L Mitchell

Thomas E Lock

Barry G Wilson

Grain defect scanning takes into account a broad set of data representing both wood grain structure and wood grain image to provide a multi-dimensional scan vector for an inspection point with wide variation therein relative to defect types. A library of similarly structured multi-dimensional training set vectors developed during a preliminary training session with known defect types is referenced by multivariate pattern recognition analysis to classify a collection of scan vectors associated with an article under inspection. By statistically matching scan vectors with training set vectors under pattern recognition analysis, physical locations on a wood article are identified according to known defect types.

Lumber defect scanning including multi-dimensional pattern recognition

A scanning system for wood products to detect grain defects and product geometry simultaneously. Multiple scanner sets cast parallel beams of light at an angle of incidence in a plane that is normal to the surface of the wood product. Scanner sets are provided to scan both the top and bottom surfaces of the wood product. The scanner sets include detector arrays to detect the reflected light of the beams off the surface of the product. One array of each set is positioned strategic to the angle of incidence and another is positioned strategic to the angle of specular reflection. The magnitudes of the detector are compared to determine clear wood or grain defect. The time of detection is used to calculate thickness/geometry.

Scanning system for lumber

Grain structure defect scanning is accomplished by a pair of light detectors directed toward an inspection point illuminated by a collimated light beam incident upon the inspection surface at a given angle of incidence. One detector, the specular detector, is positioned generally along the specular angle of reflection as defined by the angle of incidence and the other detector, the diffuse detector, lies substantially along the angle of incidence. When specular reflection dominates, as when the inspection point corresponds to clearwood, the specular detector indicates a higher reflective light intensity than the diffuse detector. When diffuse reflection dominates, however, as when the inspection point corresponds to a grain defect, both detectors indicate similar reflective light intensity. Grain defect discrimination is accomplished by calculating a ratio of specular detector output to diffuse detector output. Further analysis of the relative magnitudes of the detector outputs provides a basis for identifying grading marks, such as ink and wax marks, at the inspection point.

Reflective grain defect scanning

The invention is a method for measuring fiber angle in a fibrous solid material relative to three mutually orthogonal reference axes. It is particularly well suited for measuring diving grain and grain surface angle in wood. The method is based on the measurement of the intensity of reflected light at different azimuthal angles when a beam of light of small diameter is impinged upon the surface. The nature of the specular reflections from a light beam striking the surface of a cylinder serves as a model for the system. A preferred apparatus for practicing the method comprises a light source, which may be a low powered laser, aimed normal to the surface of the fibrous material. A plurality of photosensors lying in a plane normal to the axis of the light beam are placed around the light source to detect the light reflected at various azimuthal angles. When the fibers of the material lie normal to the light beam, reflected light maxima are seen 180.degree. apart at positions normal to the longitudinal axis of the fibers. If the fiber axes in the material are tilted out of normalcy with respect to the incoming light beam, even though the surface of the material is normal, the azimuthal angle between the reflected light maxima decreases as a function of the tilt angle. Various alternative methods include the use of an on-axis photosensor with a multiplexed series of light sources arranged around the axis. These lights may be used simultaneously if they are of different wavelengths and the photosensor employs a beam splitting and filtering system sensitive to each different light source.

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Seattle, WA, United States of America

Jon F Soest