Cypress Semiconductor Corporation

Xilinx, Inc.

Johnie Au

Chia Jen Chang

Parinda Mekara

Sangeeta Thakur

Pidugu L Narayana

Fu-Hing Ho

Leakage current estimation for a circuit can include generating a cell leakage library including cell-level leakage current geometry data for different states of cells of a cell library, wherein the cells are specified as transistor-level netlists, and determining, using a processor, gate-level leakage current geometry data for gates of a gate-level netlist for the circuit based upon states of the gates for a selected operating state of the circuit and the cell-level leakage current geometry data. Total leakage current geometry data can be determined, using the processor, for the gate-level netlist by aggregating the gate-level leakage current geometry data.

Static leakage current and power estimation

An apparatus comprising a flag generation circuit configured to generate a full flag signal in response to (i) a read clock signal, (ii) a write clock signal and (iii) a look ahead bitwise comparison configured to detect when a read count signal and a write count signal are equal.

High speed FIFO synchronous programmable full and empty flag generation

A state machine comprising a first input receiving a first read clock, a second input receiving a first write clock, a third input receiving a first programmable Almost Full look-ahead signal, a fourth input receiving a second read clock, a fifth input receiving a second write clock, and a sixth input receiving a second programmable Almost Full look-ahead signal is disclosed. The state machine manipulates the inputs to produce an output signal representing an Almost Full output flag that is at a first logic state when a FIFO is Almost Full and is at a second logic state when the FIFO is Not Almost Full.

High speed asynchronous and programmable state machine for generating almost full synchronous flags in a synchronous FIFO

A circuit, method and test architecture may be used for testing one or more integrated circuits that may be arranged upon a printed circuit board. Along with internal logic used by the integrated circuit during normal functioning, circuitry is included for built-in self-test. In an embodiment, the integrated circuits are semiconductor memories and include Memory Built-In Self-Test (MBIST) capability. A JTAG-compliant interface may be used to control the MBIST circuitry so that MBIST test modes can be selected by the JTAG Test Access Port controller, and MBIST test results can be written into boundary scan cells and scanned out through the JTAG Test Data Out port. The addition of a high-speed clock signal to the standard 4-wire JTAG interface allows full-speed operation of the MBIST circuitry. Therefore, the integrated circuit can be tested at full speed, and the test results scanned out by the slower JTAG clock. The use of the JTAG interface with MBIST allows multiple interconnected devices to be tested using a single interface. This is advantageous for in-circuit testing, since it is not necessary to directly probe each device to be tested. It also simplifies the use of automated test equipment, since the JTAG standard is widely used.

Semiconductor memory self-test controllable at board level using standard interface

An apparatus comprising a flag generation circuit configured to generate an empty flag signal in response to (i) a read clock, (ii) a write clock and (iii) a look ahead bitwise comparison configured to detect when a write count signal minus a read count signal is equal to 1.

A circuit comprising a clock generator and a state machine. The clock generator may be configured to generate an output clock signal in response to (i) a first enable signal and (ii) a second enable signal. The state machine may be configured to generate the second enable signal in response to a first and a second control signal.

Circuits, architectures, and methods for generating a periodic signal in a memory

A state machine comprising a first input receiving a first write clock, a second input receiving a first read clock, a third input receiving a first programmable Almost Empty look-ahead signal, a fourth input receiving a second write clock, a fifth input receiving a second read clock, and a sixth input receiving a second programmable Almost Empty look-ahead signal is disclosed. The state machine manipulates the inputs to produce an output signal representing an Almost Empty output flag that is at a first logic state when a FIFO is Almost Empty and is at a second logic state when the FIFO is Not Almost Empty.

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Cupertino, CA, United States of America

Johnie Au