Micron Technology Incorporated

Johnathan L Gossi

Martin Brox

Christopher John Kawamura

Jiyun Li

C Omar Benitez

Methods, systems, and devices for techniques for generating access line voltages are described. A system may use a first voltage supply and a second voltage supply that is configured to supply a lower voltage than the first voltage supply. The system may activate a first circuit to couple a node with the first voltage supply so that a first voltage develops on the node from the first voltage supply. The system may activate a second circuit to couple the node with the second voltage supply so that a second voltage that is lower than the first voltage develops on the node from the second voltage supply.

Generating access line voltages

Methods, systems, and devices for a compression method for defect visibility in a memory device are described. A memory device may identify one or more errors associated with a set of memory cells of a memory array in the device based on a first set of data associated with the first set of memory cells. The memory device may generate an indication of a location of the one or more errors in the first set of memory cells and compress the first set of data to generate an error flag based on identifying the one or more errors. The memory device may output the error flag and the indication of the location based on generating the error flag and the indication.

Growing community of inventors

Boise, ID, United States of America

Johnathan L Gossi