Universal Instruments Corporation

Agility Communications, Inc.

John William Herman

Timothy Butrie

Joseph Edward Riska

Lu Fang

John Joseph Pichura

Rory Keene Schlenker

John J Pichura

A test device is disclosed for verifying the accuracy of a pick and place process. The test device includes a surface configured to receive components, and a ferromagnetic layer located under the surface. A system is further disclosed including the test device and a plurality of components each including a magnetic element, the plurality of components configured to be received by a plurality of pockets of the test device. A method of picking and placing a component onto the test device is further disclosed.

Test device for establishing, verifying, and/or managing accuracy

An optoelectronic device comprising a laser and a lens for generating collimated light, a locker including an etalon for wavelength locking the collimated light, a first thermoelectric cooler coupled to the laser, and a second thermoelectric cooler coupled to the locker, wherein the first and second thermo-electric coolers arc independently controlled and the second thermo-electric cooler provides for temperature tuning of the etalon.

Dual thermoelectric cooler optoelectronic package and manufacture process

Growing community of inventors

Binghamton, NY, United States of America

John William Herman