University of Michigan

Advanced Fiber Sensors, Inc.

John Whitaker

Kyoung Yang

Linda P B Katehi

Ronald M Reano

An optical fiber-mounted field sensor for measuring an electric or magnetic field includes an optical fiber configured to receive light from a laser source, a polarizer, a polarization manipulator, electro-optical material or magneto-optical material adjacent to the polarization manipulator, and a high reflection coating. The polarizer is adjacent to an output of the fiber, while the polarization manipulator is adjacent to the polarizer and opposite of the optical fiber. The electro-optical material or magneto-optical material is adjacent to the polarization manipulator, and the high reflection coating is adjacent to the electro-optical material or magneto-optical material. An optical mainframe for sending and receiving optical beams to and from the optical fiber-mounted field sensor is also described.

Optical mainframe system

Optical probe system and method

An apparatus and method to simultaneously measure electric and thermal fields with a single probe. Using an electrooptic semiconductor probe, the Pockels effect is employed to measure electric field magnitude and phase, and the effect of photon absorption due to bandtail states in the semiconductor is used to measure temperature. Techniques to scale relative electric-field measurements to absolute units (volts/meter), stabilize electric-field phase drift, and calibrate electric-field data that is corrupted when the probe is used in regions where temperature gradients exist are provided.

Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe

A microwave and millimeter-wave electric-field mapping system based on electro-optic sampling has been developed using micromachined Gallium Arsenide crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages. A microwave electric-field-mapping system based on micromachined GaAs electro-optic sampling probes mounted on gradient index lenses and single-mode optical fibers can extract field images from the interior of an enclosed microwave cavity.

Growing community of inventors

Dexter, MI, United States of America

John Whitaker