Cerprobe Corporation

John W Tarzwell

Patrick James Tarzwell

Theodore R Myers

Jack L Eddings

John C Dahl

Barry M Hyland

A probe assembly is described for providing temporary connection to electrical circuits under test such as integrated circuits and the like. Individual probes are formed of suitable metal and are provided with a 90.degree. bend to create a depending portion for contact with a pad of a circuit under test and to form a supported length extending along a slot formed in the surface of a probe guide. The slot in the probe guide terminates at a hole for receiving the depending portion of the probe; the probe is supported by and positioned by the probe guide within the slot and hole provided therefore; an elastomeric pad is placed over a portion of the probe in the slot and a pressure plate urges the elastomer into contact with the probe to provide biasing force to urge the probe to extend through the probe guide hole into contact with the pad of the circuit under test. The pressure plate may contain signal traces for connection to the supported length of the probe to permit signals to be communicated from the probe tip in contact with the pad to a location remote from the probe.

Probe system for device and circuit testing

A probe device for testing integrated circuit wafers is disclosed. The probe device comprises a support means, which has metallized portions, and an aperture. A plurality of 'L' shaped holding means, each having a thin metallized surface, are coupled to metallized portions of the support means so that a portion of the holding means extends into the aperture. Coupled to the metallized surface of each of the holding means is a corresponding needle-like probe member which has a curved portion. These probe members are coupled to the holding means in such a manner that their curved portions extend into the support means aperture so as to electrically contact a circuit wafer placed therein, and thereby electrically couple the circuit wafer to the support means, and ultimately to circuit testing apparatus.

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Scottsdale, AZ, United States of America

John W Tarzwell