Growing community of inventors

Tabb, VA, United States of America

John W Simpson

Average Co-Inventor Count = 3.62

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 107

John W SimpsonRussell A Wincheski (8 patents)John W SimpsonMin Namkung (6 patents)John W SimpsonJames Paul Fulton (5 patents)John W SimpsonShridhar C Nath (5 patents)John W SimpsonRonald G Todhunter (3 patents)John W SimpsonC Gerald Clendenin (1 patent)John W SimpsonJohn W Simpson (8 patents)Russell A WincheskiRussell A Wincheski (18 patents)Min NamkungMin Namkung (14 patents)James Paul FultonJames Paul Fulton (12 patents)Shridhar C NathShridhar C Nath (5 patents)Ronald G TodhunterRonald G Todhunter (3 patents)C Gerald ClendeninC Gerald Clendenin (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. The United States of America As Represented by the Administrator of the (4 from 2,546 patents)

2. United States of America As Represented by the Administrator of Nasa (3 from 2,453 patents)

3. The United States of America As Represented by the United States (1 from 3,975 patents)


8 patents:

1. 8717012 - Eddy current probe for surface and sub-surface inspection

2. 8164328 - Eddy current system and method for crack detection

3. 6888346 - Magnetoresistive flux focusing eddy current flaw detection

4. 5942894 - Radially focused eddy current sensor for detection of longitudinal flaws

5. 5847562 - Thickness gauging of single-layer conductive materials with two-point

6. 5698977 - Eddy current method for fatigue testing

7. 5648721 - Rotating flux-focusing eddy current probe for flaw detection

8. 5617024 - Flux focusing eddy current probe

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